ZSSC4151 Datasheet

© 2016 Integrated Device Technology, Inc.

7

April 20, 2016

No.

Parameter

Symbol

Conditions

Min

Typ

Max

Unit

2.3.6.10

DNL

-1.5

1.5

LSB

2.3.6.11

INL TQA temperature range

(specified in 2.2.2)

3)

-5

5

LSB

2.3.6.12

INL TQE temperature range

(specified in 2.2.2)

-8

8

LSB

2.3.6.13

Output leakage current

at 125°C

In the event of power or

ground loss

-12

12

µA

2.3.6.14

Output leakage current

at 150°C

In the event of power or

ground loss

-20

20

µA

2.3.7.

System Response

2.3.7.1

Startup time

3), 4)

(time to first valid output

after power-on)

ADC: 14-bit and 2

conversion

5

ms

2.3.7.2

Response time

3) 4) 5)

100% input step,

excluding transmission time

1.1

ms

2.3.7.3

Bandwidth

3)

In comparison to analog

signal conditioners;

66% jump

1

kHz

2.3.7.4

Analog output noise

peak-to-peak

3)

DAC and output buffer only;

bandwidth

≤ 10kHz

10

mV

2.3.7.5

Analog output noise

RMS

3)

DAC and output buffer only;

bandwidth

≤ 10kHz

3

mV

2.3.7.6

Ratiometricity error

3)

Maximum error of

VDDE range = 4.5V to 5.5V

-1000

1000

ppm

2.3.7.7

Overall error

6)

TQA temperature range

(specified in 2.2.2)

0.35

% FSO

TQE temperature range

(specified in 2.2.2)

0.5

1)

Excluding bridge supply current and excluding output current at AOUT pin.

2)

Oscillator frequency can be trimmed via a setting in nonvolatile memory (NVM).

3)

No measurement in mass production; parameter is guaranteed by design and/or quality observation.

4)

No bridge settling included in timing.

5)

Dependent on the configuration. The specified limit is valid only for ADC resolutions

6)

range.