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STF6N80K5 Datasheet(PDF) 5 Page - STMicroelectronics |
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STF6N80K5 Datasheet(HTML) 5 Page - STMicroelectronics |
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5 / 15 page ![]() DocID024664 Rev 4 5/15 STF6N80K5, STFI6N80K5 Electrical characteristics 15 The built-in back-to-back Zener diodes are specifically designed to enhance the ESD performance of the device. The Zener voltage facilitates efficient and cost-effective device integrity protection,thus eliminating the need for additional external componentry. Table 6. Switching times Symbol Parameter Test conditions Min. Typ. Max. Unit td(on) Turn-on delay time VDD = 400 V, ID = 2.25 A, RG = 4.7 Ω, VGS = 10 V (see Figure 14: Switching times test circuit for resistive load and Figure 19: Switching time waveform) -16 - ns tr Rise time - 7.5 - ns td(off) Turn-off delay time - 28.5 - ns tf Fall time - 16 - ns Table 7. Source drain diode Symbol Parameter Test conditions Min. Typ. Max. Unit ISD Source-drain current - 4.5 A ISDM (1) 1. Pulse width limited by safe operating area Source-drain current (pulsed) - 18 A VSD (2) 2. Pulsed: pulse duration = 300 µs, duty cycle 1.5% Forward on voltage ISD = 4.5 A, VGS = 0 - 1.5 V trr Reverse recovery time ISD = 4.5 A, VDD = 60 V di/dt = 100 A/µs, (see Figure 16: Test circuit for inductive load switching and diode recovery times) - 280 ns Qrr Reverse recovery charge - 2.2 μC IRRM Reverse recovery current - 15.5 A trr Reverse recovery time ISD = 4.5 A,VDD = 60 V di/dt = 100 A/µs, Tj = 150 °C (see Figure 16: Test circuit for inductive load switching and diode recovery times) - 450 ns Qrr Reverse recovery charge - 3.15 μC IRRM Reverse recovery current - 14 A Table 8. Gate-source Zener diode Symbol Parameter Test conditions Min. Typ. Max. Unit V(BR)GSO Gate-source breakdown voltage IGS = ±1mA, ID = 0 30 - - V |
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