AST1S31HF datasheet(8/33 Pages) STMICROELECTRONICS

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Datasheet parameters over the temperature range

AST1S31HF

8/33

DocID026968 Rev 2

Datasheet parameters over the temperature range

The 100% of the population in the production flow is tested at three different ambient

temperatures (-40 °C, +25 °C, +125 °C) to guarantee the datasheet parameters inside the

junction temperature range (-40 °C, +125 °C).

The device operation is guaranteed when the junction temperature is inside the (-40 °C,

+125 °C) temperature range. The designer can estimate the silicon temperature increase

respect to the ambient temperature evaluating the internal power losses generated during

the device operation.

However the embedded thermal protection disables the switching activity to protect the

device in case the junction temperature reaches the TSHDN (+150 °C typ.) temperature.

All the datasheet parameters can be guaranteed to a maximum junction temperature of

+125 °C to avoid triggering the thermal shutdown protection during the testing phase

because of self-heating.

AST1S31HF Datasheet(PDF) 8 Page - STMicroelectronics