| Electronic Components Datasheet Search |
|
SSD80N03 Datasheet(PDF) 2 Page - SeCoS Halbleitertechnologie GmbH |
|
|
|||||||||||||||||||||||||||||
SSD80N03 Datasheet(HTML) 2 Page - SeCoS Halbleitertechnologie GmbH |
|
2 / 4 page ![]() Elektronische Bauelemente SSD80N03 80A , 30V , RDS(ON) 5.5m N-Ch Enhancement Mode Power MOSFET 09-Jan-2015 Rev. A Page 2 of 4 http://www.SeCoSGmbH.com/ Any changes of specification will not be informed individually. ELECTRICAL CHARACTERISTICS (TJ=25°C unless otherwise specified) Parameter Symbol Min. Typ. Max. Unit Teat Conditions Static Drain-Source Breakdown Voltage BVDSS 30 - - V VGS=0, ID=250µA Gate-Threshold Voltage VGS(th) 1.0 - 2.5 V VDS=VGS, ID=250µA Forward Transconductance gfs - 43 - S VDS=5V, ID=30A Gate-Source Leakage Current IGSS - - ±100 nA VGS= ±20V TJ =25°C - - 1 V DS=24V, VGS=0 Drain-Source Leakage Current TJ =55°C IDSS - - 5 µA VDS=24V, VGS=0 - - 5.5 VGS=10V, ID=30A Static Drain-Source On-Resistance 2 RDS(ON) - - 8 m VGS=4.5V, ID=15A Total Gate Charge Qg - 20 - Gate-Source Charge Qgs - 7.6 - Gate-Drain (“Miller”) Change Qgd - 7.2 - nC ID=15A VDS=15V VGS=4.5V Turn-on Delay Time Td(on) - 7.8 - Rise Time Tr - 15 - Turn-off Delay Time Td(off) - 37.3 - Fall Time Tf - 10.6 - nS VDD=15V ID=15A VGS=10V RG=3.3 Input Capacitance Ciss - 2295 - Output Capacitance Coss - 267 - Reverse Transfer Capacitance Crss - 210 - pF VGS =0 VDS=15V f =1.0MHz Guaranteed Avalanche Characteristics Single Pulse Avalanche Energy 5 EAS 63 - - mJ VDD=25V,L=0.1mH , IAS=24A Source-Drain Diode Diode Forward Voltage 2 VSD - - 1 V IS=1A, VGS=0 Continuous Source Current 1,6 IS - - 80 A Pulsed Source Current 2,6 ISM - - 160 A VD=VG=0, Force Current Reverse Recovery Time TRR - 14 - nS Reverse Recovery Charge QRR - 5 - nC IF=30A, dl/dt=100A/µS TJ =25°C Notes: 1. The data tested by surface mounted on a 1 inch2 FR-4 board with 2OZ copper. 2. The data tested by pulsed , pulse width≦300µs , duty cycle≦2% 3. The EAS data shows Max. rating . The test condition is VDD=25V,VGS=10V,L=0.1mH,IAS=48A 4. The power dissipation is limited by 150°C junct ion temperature 5. The Min. value is 100% EAS tested guarantee. 6. The data is theoretically the same as ID and IDM , in real applications , should be limited by total power dissipation. |
|
|
Link URL |
| Does ALLDATASHEET help your business so far? [ DONATE ] |
About Alldatasheet | Advertisement | Contact us | Privacy Policy | Link to Datasheet | Link Exchange | Manufacturer List All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |