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LF355 Datasheet(PDF) 12 Page - National Semiconductor (TI) |
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LF355 Datasheet(HTML) 12 Page - National Semiconductor (TI) |
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12 / 23 page ![]() Typical Applications Settling Time Test Circuit 00564616 • Settling time is tested with the LF155/6 connected as unity gain inverter and LF357 connected for A V =−5 • FET used to isolate the probe capacitance • Output = 10V step • A V = −5 for LF357 Large Signal Inverter Output, V OUT (from Settling Time Circuit) LF355 00564617 LF356 00564618 LF357 00564619 www.national.com 12 |
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