AD5547 datasheet(4/20 Pages) AD

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AD5547/AD5557

Rev. 0 | Page 4 of 20

Parameter

Symbol

Conditions

Min

Typ

Max

Unit

AC CHARACTERISTICS4

Output Voltage Settling Time

To ±0.1% of full scale, data cycles from zero scale

to full scale to zero scale

0.5

µs

Reference Multiplying BW

VREF = 5 V p-p, data = full scale

MHz

DAC Glitch Impulse

VREF = 0 V, midscale to midscale – 1

nV-s

Multiplying Feedthrough Error

VOUT/VREF

VREF = 100 mV rms, f = 10 kHz

–65

Digital Feedthrough

WR = 1, LDAC toggles at 1 MHz

nV-s

Total Harmonic Distortion

THD

VREF = 5 V p-p, data = full scale, f = 1 kHz

–85

Output Noise Density

f = 1 kHz, BW = 1 Hz

nV/√Hz

Analog Crosstalk

CAT

Signal input at Channel A and measure the output

at Channel B, f = 1 kHz

–95

1 All static performance tests (except IOUT) are performed in a closed-loop system using an external precision OP97 I-V converter amplifier. The device RFB terminal is tied

to the amplifier output. The OP97’s +IN pin is grounded, and the DAC’s IOUT is tied to the OP97’s –IN pin. Typical values represent average readings measured at 25°C.

2 Guaranteed by design; not subject to production testing.

3 All input control signals are specified with tR = tF = 2.5 ns (10% to 90% of 3 V), and are timed from a voltage level of 1.5 V.

4 All ac characteristic tests are performed in a closed-loop system using an AD841 I-V converter amplifier.

tWR

tDS

tDH

tLWD

tLDAC

tRS

DATA

LDAC

Figure 3. AD5547/AD5557 Timing Diagram

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