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GLT44016 Datasheet(PDF) 5 Page - List of Unclassifed Manufacturers

Part # GLT44016
Description  256K X 16 CMOS DYNAMIC RAM WITH EXTENDED DATA OUTPUT
PDF  17 Pages
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Manufacturer  ETC [List of Unclassifed Manufacturers]
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G -LINK
GLT44016
256K X 16 CMOS DYNAMIC RAM WITH EXTENDED DATA OUTPUT
Aug, 2000(Rev.3.1)
G-Link Technology Corporation
2701Northwestern Parkway
Santa Clara, CA 95051, U.S.A.
G-Link Technology Corporation,Taiwan
6F, No. 24-2, Industry E. RD. IV, Science Based
Industrial Park, Hsin Chu, Taiwan.
- 5 -
DC and Operating Characteristics (1-2)
TA = 0
°C to 70°C, V
CC=5V
±10%, V
SS=0V, unless otherwise specified.
Sym.
Parameter
Test Conditions
Access
Time
Min.
Typ
Max. Unit Notes
ILI
Input Leakage Current
(any input pin)
0V
≤ V
IN
≤ 5.5V
(All other pins not under
test=0V)
-10
+10
µA
ILO
Output Leakage Current
(for High-Z State)
0V
≤ V
out
≤ 5.5V
Output is disabled (Hiz)
-10
+10
µA
ICC1
Operating Current,
Random READ/WRITE
tRC = tRC (min.)
tRAC = 25ns
tRAC = 28ns
tRAC = 30ns
tRAC = 35ns
tRAC = 40ns
tRAC = 50ns
270
270
250
210
190
170
mA
1,2
ICC2
Standby Current,(TTL)
RAS , UCAS , LCAS at V
IH
other inputs
≥V
SS
4
mA
ICC3
Refresh Current,
RAS -Only
RAS cycling, UCAS ,
LCAS at V
IH
tRC = tRC (min.)
tRAC = 25ns
tRAC = 28ns
tRAC = 30ns
tRAC = 35ns
tRAC = 40ns
tRAC = 50ns
270
270
250
210
190
170
mA
2
ICC4
Operating Current,
EDO Page Mode
RAS at V
IL, UCAS , LCAS
address cycling:tPC=tPC(min.)
tRAC = 25ns
tRAC = 28ns
tRAC = 30ns
tRAC = 35ns
tRAC = 40ns
tRAC = 50ns
270
270
250
210
190
170
mA
1,2
ICC5
Refresh Current,
CAS Before RAS
RAS , UCAS , LCAS
address cycling:
tRC=tRC (min.)
tRAC = 25ns
tRAC = 28ns
tRAC = 30ns
tRAC = 35ns
tRAC = 40ns
tRAC = 50ns
270
270
250
210
190
170
mA
1
ICC6
Standby Current, (CMOS)
RAS
≥V
CC-0.2V,
UCAS
≥V
CC-0.2V,
LCAS
≥V
CC-0.2V,
All other inputs VSS
2
mA
VIL
Input Low Voltage
-1
+0.8
V
3
VIH
Input High Voltage
2.4
VCC+1
V
3
VOL
Output Low Voltage
IOL = 4.2mA
0.4
V
VOH
Output High Voltage
IOH = -5.0mA
2.4
V
Notes:
1.ICC is dependent on output loading when the device output is selected. Specified ICC(max.) is measured with the output open.
2.ICC is dependent upon the number of address transitions specified ICC(max.) is measured with a maximum of one transition per address cycle in
random Read/Write and EDO Fast Page Mode.
3.Specified VIL(min.) is steady state operation. During transitions VIL(min.) may undershoot to -1.0V for a period not to exceed 20ns. All AC
parameters are measured with VIL(min.)
≥V
SS and VIH(max.)
≤V
CC.



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