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MN100314 Datasheet(PDF) 5 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Part # MN100314
Description  LOW POWER QUINT DIFFERENTIAL LINE RECEIVER
PDF  7 Pages
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Manufacturer  NSC [National Semiconductor (TI)]
Direct Link  http://www.national.com
Logo NSC - National Semiconductor (TI)

MN100314 Datasheet(HTML) 5 Page - National Semiconductor (TI)

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MN100314-X REV 1A0
MILITARY DATA SHEET
Electrical Characteristics
AC PARAMETERS
(The following conditions apply to all the following parameters, unless otherwise specified.)
AC:
Vee Range: -4.2V to -5.7V, VCC=VCCA=GND, LOADING: 50 Ohms To -2.0V
SYMBOL
PARAMETER
CONDITIONS
NOTES
PIN-
NAME
MIN
MAX
UNIT
SUB-
GROUPS
tPLH/tPHL
Propagation Delay
Vee= -4.2/-5.7V
2, 4 Dn/Dn t
o On/On
0.6
2.2
ns
9
2, 4 Dn/Dn t
o On/On
0.6
2.7
ns
10
2, 4 Dn/Dn t
o On/On
0.4
2.3
ns
11
tTLH/tTHL
Transition Time
Vee= -4.2/-5.7V
6
On/On
0.2
1.4
ns
9, 10,
11
Note 1:
Screen tested 100% on each device at -55 C, +25 C and +125 C temp., subgroups 1, 2,
3, 7 & 8.
Note 2:
For QB devices, screen tested 100% on each device at +25C temperature only, subgroup
A9.
For QMLV devices, screen tested 100% on each device at +25C, +125C & -55C
temperature, subgroups A9, 10 & 11.
Note 3:
Sample tested (Method 5005, Table 1) on each MFG. lot at +25 C, +125 C & -55 C temp.,
subgroups A1, 2, 3, 7 & 8.
Note 4:
Sample tested (Method 5005, Table 1) on each MFG. lot at +25 C, subgroup A9, and at
+125 C & -55 C temp., subgroups A10 & 11.
Note 5:
Sample tested (Method 5005, Table 1) on each MFG. lot at +25 C temp. only, subgroup
A9.
Note 6:
Not tested at +25 C, +125 C & -55 C temp. (DESIGN CHARACTERIZATION DATA).
Note 7:
Guaranteed by applying specified input condition and testing VOH/VOL.
5



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