AD9670EBZ datasheet(45/48 Pages) AD

45 / 48 page

AD9674

Data Sheet

Rev. A | Page 44 of 47

Addr.

(Hex) RegisterName

Bit 7 (MSB)

Bit 6

Bit 5

Bit 4

Bit 3

Bit 2

Bit 1

Bit 0 (LSB)

Default

Value Comments

0x110 DIG_OFFSET_

CORR1

0x00

Offset correction LSB

(local, chip).

0x111 DIG_OFFSET_

CORR2

D15

D14

D13

D12

D11

D10

0x00

Offset correction MSB

(local, chip).

Digital offset calibration (read back if auto calibration enabled with Register 0x10F.

Otherwise, force correction value.)

Offset correction = [D15:D0] × AFULL-SCALE/216,

0111 1111 1111 1111 (215 − 1) = +1/2 × AFULL-SCALE − 1/216 × AFULL-SCALE,

0111 1111 1111 1110 (215 − 2) = +1/2 × AFULL-SCALE − 2/216 × AFULL-SCALE,

…,

0000 0000 0000 0001 (+1) = 1/216 × AFULL-SCALE,

0000 0000 0000 0000 = no correction (default),

1111 1111 1111 1111 (−1) = −1/216 × AFULL-SCALE,

…,

1000 0000 0000 0000 (−215) = −1/2 AFULL-SCALE

0x112 POWER_

MASK_CONFIG

Power-up setup time (POWER_SETUP):

0 0000 = 0,

0 0001 = 1 × 40/fSAMPLE,

0 0010 = 2 × 40/fSAMPLE (default),

0 0011 = 3 × 40/fSAMPLE,

…,

1 1111 = 31 × 40/fSAMPLE

0x02

Power setup time used to

set the power-up time

(global).

0x113 DIG_CONFIG

Digital

high-pass

filter:

0=enable

(default),

1 = bypass

Decimator and

filter enable:

00 = RF 2× decimator

bypassed (default),

01 = RF 2× decimator

enabled and low

band filter,

1X = RF 2× decimator

enabled and high band

filter,

0x00

Enables stages of the

digital processing (global).

0x115 CHIP_ADDR_EN

Chip

address

mode:

0=disable

(default),

1=enable

Chip address qualifier:

0 0000 (default), if read, returns state of

Pin ADDR4 to Pin ADDR0

0x00

Chip address mode

enables the addressing of

specific devices if the value

of Bits[4:0] qualifier equals

the state on the ADDR4 to

ADDR0 pins (global).

0x116 ANALOG_

TEST_TONE

Analog test signal

amplitude

(see Table 17 to

Table 19)

Analog test signal

frequency:

00 = fSAMPLE/4 (default),

01 = fSAMPLE/8,

10 = fSAMPLE/16,

11 = fSAMPLE/32

0x00

Analog test tone

amplitude and frequency

(global).

0x117 DIG_SINE_

TEST_FREQ

Digital test tone frequency:

0 0000 = 1 × fSAMPLE/64,

0 0001 = 2 × fSAMPLE/64,

…,

1 1111 = 32 × fSAMPLE/64

0x00

Digital sine test tone

frequency (global).

0x118 DIG_SINE_

TEST_AMP

Digital test tone amplitude:

0000 = AFULL-SCALE (default),

0001 = AFULL-SCALE/2,

0010 = AFULL-SCALE/22,

…,

1111 = AFULL-SCALE/215

0x00

Digital sine test tone

amplitude (global).

0x119 DIG_SINE_

TEST_OFFSET

Offset multiplier (a):

0 1111 = 15,

0 1110 = 14,

…,

0 0000 = 0 (default),

1 1111 = −1,

…,

1 0000 = −16

Offset exponent (b):

000 = 0 (default),

001 = 1,

…,

111 = 7

0x00

Digital sine test tone offset

(global).

Offset = AFULL-SCALE × a × 2−(13−b), offset range is ~0.5 dB,

maximum positive offset = 15 × 2−(13−7) = 0.25 × AFULL-SCALE,

maximum negative offset = –16 × 2−(13−7) ≈ −0.25 × AFULL-SCALE

0x11A TEST_MODE_

CH_ENABLE

Channel H enable:

0 = off (default),

1 = on

ChannelG

enable:

0 = off

(default),

1 = on

Channel F

enable:

0 = off

(default),

1 = on

Channel E

enable:

0 = off

(default),

1 = on

ChannelD

enable:

0 = off

(default),

1 = on

ChannelC

enable:

0 = off

(default),

1 = on

ChannelB

enable:

0 = off

(default),

1 = on

ChannelA

enable:

0 = off

(default),

1 = on

0x00

Enables channels for test

mode (global).

AD9670EBZ Datasheet(PDF) 45 Page - Analog Devices

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