5812-DS00-R datasheet(62/84 Pages) BOARDCOM

62 / 84 page

BCM5812

Advance Data Sheet

3/11/03

B roa dcom Co rpo rat ion

Page 54

Signal Definitions

Document

5812-DS01-405-R

TCK

Test mode clock for JTAG boundary scan. Unused in normal operation; connect to

either high or low static level. It is internally pulled up.

TDI

Test data in for JTAG boundary scan. Unused in normal operation; connect to either

high or low static level. It is internally pulled up.

TDO

Test data out for JTAG boundary scan. Unused in normal operation.

RNGOSC

Optional random number generator oscillator. It is Ex-ORed with internal oscillator to

provide random number source. It is internally pulled down.

EEPROM

If EEPROM is Low, the PCI configuration space is loaded from attached EEPROM.

Otherwise, the PCI configuration space contains default values. It is internally pulled

up.

EEPROM_CS

Chip Select for the attached EEPROM. It connects to Chip Select pin of the EEPROM.

EEPROM_SK

Serial Clock for the attached EEPROM. It connects to Serial Clock pin of the

EEPROM.

EEPROM_DI

Data In for the attached EEPROM. It connects to Data Out pin of the EEPROM.

EEPROM_DO

Data Out for the attached EEPROM. It connects to Data In pin of the EEPROM.

NC1... NC10

–

Test pins, must be left unconnected (floating).

Table 17: Signal Definitions (Cont.)

Signal Name

I/O

Description

5812-DS00-R Datasheet(PDF) 62 Page - Broadcom Corporation.