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TT410 Datasheet(PDF) 2 Page - Diodes Incorporated

Part # TT410
Description  4A SURFACE MOUNT GLASS PASSIVATED BRIDGE RECTIFIER
PDF  5 Pages
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Manufacturer  DIODES [Diodes Incorporated]
Direct Link  http://www.diodes.com
Logo DIODES - Diodes Incorporated

TT410 Datasheet(HTML) 2 Page - Diodes Incorporated

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TT410
Document number: DS39107 Rev. 4 - 2
2 of 5
www.diodes.com
March 2017
© Diodes Incorporated
TT410
Maximum Ratings (@TA = +25°C, unless otherwise specified.)
Single phase, half wave, 60Hz, resistive or inductive load.
For capacitive load, derate current by 20%.
Characteristic
Symbol
Value
Unit
Peak Repetitive Reverse Voltage
Working Peak Reverse Voltage
DC Blocking Voltage
VRRM
VRWM
VR
1,000
V
RMS Reverse Voltage
VR(RMS)
700
V
Average Rectified Output Current
(Note 5) @ TA = +25°C
IO
4.0
A
Non-Repetitive Peak Forward Surge Current, 8.3ms
Single Half Sine-Wave Superimposed on Rated Load
IFSM
120
A
Non-Repetitive Peak Forward Surge Current, 1.0ms
Single Half Sine-Wave Superimposed on Rated Load
IFSM
240
A
I
2
t Rating for Fusing (1ms < t < 8.3ms)
I
2
t
59
A
2
S
Thermal Characteristics
Characteristic
Symbol
Value
Unit
Typical Thermal Resistance, Junction to Ambient (Note 5)
(Per Element)
RθJA
13
°C/W
Typical Thermal Resistance, Junction to Lead (Per Element)
RθJL
8
°C/W
Typical Thermal Resistance, Junction to Case (Per Element)
RθJC
3
°C/W
Operating and Storage Temperature Range
TJ, TSTG
-55 to +150
°C
Electrical Characteristics (@TA = +25°C, unless otherwise specified.)
Characteristic
Symbol
Min
Typ
Max
Unit
Test Condition
Reverse Breakdown Voltage (Note 6)
V(BR)R
1,000
—
—
V
IR = 10μA
Forward Voltage (Per Element)
VF
—
—
0.91
0.80
1.0
—
V
IF = 2A, TA = +25°C
IF=2A, TA = +125°C
Leakage Current (Note 6) (Per Element)
IR
—
—
0.15
55
5
500
μA
VR = 1,000V, TA = +25°C
VR = 1,000V, TA = +125°C
Total Capacitance (Per Element)
CT
—
40
—
pF
VR = 4V, f = 1.0MHz
Notes:
5. Device mounted on 15mmx12mmx1.6mm AL Pad attached on 100mmx75mmx27mm Fin heatsink. Thermal resistance test performed in accordance with
JESD-51.
6. Short duration pulse test used to minimize self-heating effect.



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