4

AMC1302-Q1

SBAS920 – OCTOBER 2018

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Copyright © 2018, Texas Instruments Incorporated

(1)

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings

only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended

Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

6 Specifications

6.1 Absolute Maximum Ratings

see

(1)

MIN

MAX

UNIT

Power-supply voltage

VDD1 to GND1

–0.3

6.5

V

VDD2 to GND2

–0.3

6.5

Input voltage

INP, INN

GND1 – 6

VDD1 + 0.5

V

Output voltage

OUTP, OUTN

GND2 – 0.5

VDD2 + 0.5

V

Input current

Continuous, any pin except power-supply pins

–10

10

mA

Temperature

150

°C

–65

150

(1)

AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification

6.2 ESD Ratings

VALUE

UNIT

Classification Level 2

±2000

V

Charged-device model (CDM), per AEC Q100-011, CDM ESD

Classification Level C6

±1000

(1)

operation. Observe analog input voltage range as specified in the Absolute Maximum Ratings table.

6.3 Recommended Operating Conditions

over operating ambient temperature range (unless otherwise noted)

MIN

NOM

MAX

UNIT

POWER SUPPLY

High-side power supply

VDD1 to GND1

3.0

5

5.5

V

Low-side power supply

VDD2 to GND2

3.0

3.3

5.5

V

ANALOG INPUTS

±64

mV

Specified linear differential input full-scale

–50

50

mV

–2

VDD1

V

Operating common-mode input voltage

–0.032

VDD1 – 2.2

V

TEMPERATURE RANGE

Specified ambient temperature

-40

125

°C