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SSM3K35FS Datasheet(PDF) 2 Page - Toshiba Semiconductor |
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SSM3K35FS Datasheet(HTML) 2 Page - Toshiba Semiconductor |
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2 / 5 page ![]() SSM3K35FS 2014-03-01 2 Switching Time Test Circuit (a) Test Circuit (b) VIN Marking Equivalent Circuit (top view) Usage Considerations Let Vth be the voltage applied between gate and source that causes the drain current (ID) to below (1 mA for the SSM3K35FS). Then, for normal switching operation, VGS(on) must be higher than Vth, and VGS(off) must be lower than Vth. This relationship can be expressed as: VGS(off) < Vth < VGS(on). Take this into consideration when using the device. Handling Precaution When handling individual devices (which are not yet mounting on a circuit board), be sure that the environment is protected against electrostatic electricity. Operators should wear anti-static clothing, and containers and other objects that come into direct contact with devices should be made of anti-static materials. VDD = 3 V Duty ≤ 1% VIN: tr, tf < 5 ns (Zout = 50 Ω) Common Source Ta = 25°C VDD OUT IN 2.5 V 0 10 μs RL (c) VOUT ton 90% 10% 0 V 2.5 V 10% 90% toff tr tf VDD VDS (ON) KZ 1 2 3 1 2 3 |
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