2N3906S datasheet(3/6 Pages) FS

3 / 6 page

Figure 1. Delay and Rise Time

Equivalent Test Circuit

*Total shunt capacitance of test jig and connectors

10 k

3 V

275

S < 4.0 pF*

10 k

3 V

275

S < 4.0 pF*

1N916

+ 0.5 V

10 < t

1 < 500

DUTY CYCLE = 2%

10.9 V

<1ns

<1 ns

– 10.6 V

+ 9.1 V

Figure 2. Storage and Fall Time

Equivalent Test Circuit

300ns

DUTY CYCLE = 2%

TYPICAL TRANSIENT CHARACTERISTICS

C , COLLECTOR CURRENT (mA)

Figure 4. Charge Data

REVERSE BIAS (VOLTS)

Figure 3. Capacitance

CC = 40 V

C / I B = 10

Q T

J = 25°C

J = 125°C

obo

ibo

1.0

2 0 3 0

5.0 7.0 10

50 70 100

200

0.1

0.2 0.3 0.5 0.7 1 0

2.0 3.0

5 0 7.0 10

20 30 40

10 0

7 0

5 0

3 0

2 0

1 0

5000

3000

2000

1000

700

500

300

200

100

C , COLLECTOR CURRENT (mA)

Figure 6. Fall Time

C , COLLECTOR CURRENT (mA)

Figure 5. Turn–On Time

CC = 40 V

B1 = I B2

r @V CC=3.0V

40 V

C /I B = 10

d@V OB=0V

2.0 V

15 V

1.0

2 0 3.0

5.0 7 0 10

50 70 100

200

500

300

200

100

1.0

2.0 3.0

5 0 7.0 10

50 70 100

200

500

300

200

100

C /I B = 10

C /I B = 20

SEMICONDUCTOR

TECHNICAL DATA

2N3906S

2008. 01. 09

3/6

Revision No : 0

2N3906S Datasheet(PDF) 3 Page - First Silicon Co., Ltd

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