Keithley’s Series 2400 Source Measure Unit (SMU)

Instruments are designed specifically for test applications

that demand tightly coupled sourcing and measurement.

All SourceMeter models provide precision voltage and

current sourcing as well as measurement capabilities.

Each SourceMeter SMU instrument is both a highly stable

DC power source and a true instrument-grade 6½-digit

multimeter. The power source characteristics include

low noise, precision, and readback. The multimeter

capabilities include high repeatability and low noise.

The result is a compact, single-channel, DC parametric

tester. In operation, these instruments can act as a voltage

source, a current source, a voltage meter, a current

meter, and an ohmmeter. Manufacturers of components

and modules for the communications, semiconductor,

computer, automotive, and medical industries will find the

SourceMeter SMU instruments invaluable for a wide range

of characterization and production test applications.

Datasheet

Key Features

• Five instruments in one (IV Source, IVR Measure)

• Five models: 20–100 W DC, 1000 W pulsed,

1100 V to 1 µV

• Source and sink (4-quadrant) operation

• 0.012% basic measure accuracy with 6½-digit

resolution

• 2-, 4-, and 6-wire remote V-source and

measure sensing

• 1700 readings/second at 4½ digits via GPIB

• Pass/Fail comparator for fast sorting/binning

• Programmable DIO port for automation/handler/

prober control (except 2401)

• Standard SCPI GPIB, RS-232 and Keithley Trigger

Link interfaces

• Download free KickStart I-V Characterization Software

for device characterization.

Advantages of a Tightly Integrated Instrument

By linking source and measurement circuitry in a single

unit, these instruments offer a variety of advantages

over systems configured with separate source and

measurement instruments. For example, they minimize

the time required for test station development, setup,

and maintenance, while lowering the overall cost of

system ownership. They simplify the test process itself

by eliminating many of the complex synchronization

and connection issues associated with using multiple

instruments. And, their compact half-rack size conserves

precious “real estate” in the test rack or bench.

A Tektronix Company