9.2.3 Application Curve

The following typical eye diagrams of the ISO672xB-Q1 family of devices indicate low jitter and wide open eye at

the maximum data rate of 50 Mbps.

Time = 5 ns / div

Figure 9-3. ISO6721B-Q1 Eye Diagram at 50 Mbps PRBS,

5-V Supplies and 25°C

9.2.3.1 Insulation Lifetime

Insulation lifetime projection data is collected by using industry-standard Time Dependent Dielectric Breakdown

(TDDB) test method. In this test, all pins on each side of the barrier are tied together creating a two-terminal

device and high voltage applied between the two sides; See Figure 9-4 for TDDB test setup. The insulation

breakdown data is collected at various high voltages switching at 60 Hz over temperature. For reinforced

insulation, VDE standard requires the use of TDDB projection line with failure rate of less than 1 part per million

(ppm). Even though the expected minimum insulation lifetime is 20 years at the specified working isolation

voltage, VDE reinforced certification requires additional safety margin of 20% for working voltage and 87.5% for

lifetime which translates into minimum required insulation lifetime of 37.5 years at a working voltage that's 20%

higher than the specified value.

DUT

Vcc 2

Vcc 1

GND 1

GND 2

A

Ovenat150°C

TimeCounter

> 1 mA

V

S

Figure 9-4. Test Setup for Insulation Lifetime Measurement

ISO6721-Q1

SLLSFF5 – JULY 2020

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