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KMA310 Datasheet(PDF) 22 Page - NXP Semiconductors

Part # KMA310
Description  Programmable angle sensor IC
PDF  71 Pages
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Manufacturer  NXP [NXP Semiconductors]
Direct Link  http://www.nxp.com
Logo NXP - NXP Semiconductors

KMA310 Datasheet(HTML) 22 Page - NXP Semiconductors

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NXP Semiconductors
KMA310
Programmable angle sensor IC
KMA310
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2019. All rights reserved.
Product data sheet
Rev. 3 — 27 February 2019
22 / 71
Supply voltage State
Analog mode
SENT mode
Vth(on) or Vth(off)
to minimum VDD
functional
operation
All analog circuits are active and the
measured angle is available at the analog
output. Not all parameters are within the
specified limits.
All analog circuits are active and the
output is set to HIGH for at least 100 µs
before SENT transmission starts. Not all
parameters are within the specified limits.
Minimum VDD to
maximum VDD
normal
operation
All analog circuits are active and the
measured angle is available at the analog
output. All parameters are within the
specified limits.
All analog circuits are active and the
measured angle is available at the digital
output. All parameters are within the
specified limits.
Maximum VDD
to Vth(ov)
functional
operation
All analog circuits are active and the
measured angle is available at the analog
output. Not all parameters are within the
specified limits.
All analog circuits are active and the
measured angle is available at the digital
output. Not all parameters are within the
specified limits.
Vth(ov) to 18 V
overvoltage
The digital core and the oscillator are active
but all other circuits are in power-down
mode. The output is set to the lower
diagnostic level.
The digital core and the oscillator
are active but all other circuits are in
power-down mode. The output buffer
drives an active LOW.
Table 34 describes the diagnostic behavior and the resulting output voltage depending
on the error case. Furthermore the duration and termination condition to enter and leave
the diagnostic mode are given, respectively.
Table 34. Diagnostic behavior
Diagnostic condition
Duration
Output
Termination condition
Low voltage
20 µs < t < 120 µs ≤ 4 %VDD
functional or normal operation
Overvoltage
20 µs < t < 120 µs ≤ 4 %VDD
functional or normal operation
Checksum error
n.a.
≤ 4 %VDD or ≥ 96 %VDD[1]
power-on reset[2]
Double-bit error
n.a.
≤ 4 %VDD or ≥ 96 %VDD[1]
power-on reset[2]
Power-loss
≤ 2 ms
≤ 4 %VDD or ≥ 96 %VDD; see Table 32
power-on reset
[1]
Depending on the diagnostic level setting.
[2]
Status bit stays set in command register until power-on reset.
10.4 Oscillator monitoring (SM-13, SM-14 and SM-15)
If the oscillator frequency differs from the target frequency by more than ±30 % or the
oscillator stops, status bit 7 of CTRL1 register is set and the output goes into diagnostic
mode; see Table 50. If the oscillator frequency differs by more than ±10 %, the SENT
timing can violate the SAE J2716 SENT specification.
10.5 Safe assure - ASIL control unit
The ASIL control includes a state machine, which is a 4-bit up-counter that defines time
slots. The different time slots are used to trigger dedicated BISTs. To enable or disable
the complete ASIL control unit globally, use the BIST bit in ASIL_SETTING register; see
Table 51. The NVM register setting enables or disables individually each integrated test.
In case a self-test was performed a ready flag is generated to reset the start test trigger
signals. In case no reset signal is found, the output is set to diagnostic mode.



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