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KMA310 Datasheet(PDF) 22 Page - NXP Semiconductors |
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KMA310 Datasheet(HTML) 22 Page - NXP Semiconductors |
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22 / 71 page ![]() NXP Semiconductors KMA310 Programmable angle sensor IC KMA310 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2019. All rights reserved. Product data sheet Rev. 3 — 27 February 2019 22 / 71 Supply voltage State Analog mode SENT mode Vth(on) or Vth(off) to minimum VDD functional operation All analog circuits are active and the measured angle is available at the analog output. Not all parameters are within the specified limits. All analog circuits are active and the output is set to HIGH for at least 100 µs before SENT transmission starts. Not all parameters are within the specified limits. Minimum VDD to maximum VDD normal operation All analog circuits are active and the measured angle is available at the analog output. All parameters are within the specified limits. All analog circuits are active and the measured angle is available at the digital output. All parameters are within the specified limits. Maximum VDD to Vth(ov) functional operation All analog circuits are active and the measured angle is available at the analog output. Not all parameters are within the specified limits. All analog circuits are active and the measured angle is available at the digital output. Not all parameters are within the specified limits. Vth(ov) to 18 V overvoltage The digital core and the oscillator are active but all other circuits are in power-down mode. The output is set to the lower diagnostic level. The digital core and the oscillator are active but all other circuits are in power-down mode. The output buffer drives an active LOW. Table 34 describes the diagnostic behavior and the resulting output voltage depending on the error case. Furthermore the duration and termination condition to enter and leave the diagnostic mode are given, respectively. Table 34. Diagnostic behavior Diagnostic condition Duration Output Termination condition Low voltage 20 µs < t < 120 µs ≤ 4 %VDD functional or normal operation Overvoltage 20 µs < t < 120 µs ≤ 4 %VDD functional or normal operation Checksum error n.a. ≤ 4 %VDD or ≥ 96 %VDD[1] power-on reset[2] Double-bit error n.a. ≤ 4 %VDD or ≥ 96 %VDD[1] power-on reset[2] Power-loss ≤ 2 ms ≤ 4 %VDD or ≥ 96 %VDD; see Table 32 power-on reset [1] Depending on the diagnostic level setting. [2] Status bit stays set in command register until power-on reset. 10.4 Oscillator monitoring (SM-13, SM-14 and SM-15) If the oscillator frequency differs from the target frequency by more than ±30 % or the oscillator stops, status bit 7 of CTRL1 register is set and the output goes into diagnostic mode; see Table 50. If the oscillator frequency differs by more than ±10 %, the SENT timing can violate the SAE J2716 SENT specification. 10.5 Safe assure - ASIL control unit The ASIL control includes a state machine, which is a 4-bit up-counter that defines time slots. The different time slots are used to trigger dedicated BISTs. To enable or disable the complete ASIL control unit globally, use the BIST bit in ASIL_SETTING register; see Table 51. The NVM register setting enables or disables individually each integrated test. In case a self-test was performed a ready flag is generated to reset the start test trigger signals. In case no reset signal is found, the output is set to diagnostic mode. |
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