LTC3534 datasheet(4/34 Pages) AD

4 / 34 page

LTC3114-1

Rev. D

For more information www.analog.com

ELECTRICAL CHARACTERISTICS

Note 1: Stresses beyond those listed under Absolute Maximum Ratings

may cause permanent damage to the device. Exposure to any Absolute

Maximum Rating condition for extended periods may affect device

reliability and lifetime.

Note 2: The LTC3114-1 is tested under pulsed load conditions such that

TJ ≈TA. The LTC3114E-1 is guaranteed to meet performance specifications

from 0°C to 85°C junction temperature. Specifications over the –40°C

to 125°C operating junction temperature range are assured by design,

characterization and correlation with statistical process controls. The

LTC3114I-1 specifications are guaranteed over the –40°C to 125°C

operating junction temperature range. The LTC3114H-1 specifications are

guaranteed over the –40°C to 150°C operating junction temperature range.

The LTC3114MP-1 specifications are guaranteed over the –55°C to 150°C

operating junction temperature range. High junction temperatures degrade

operating lifetime; operating lifetime is derated for junction temperatures

greater than 125°C. The maximum ambient temperature consistent with

these specifications is determined by specific operating conditions in

conjunction with board layout, the rated package thermal resistance and

other environmental factors.

The junction temperature (TJ in degrees Celsius) is calculated from the

ambient temperature (TA in degrees Celsius) and the power dissipation

(PD in Watts) according to the following formula:

TJ = TA + (PD • θJA)

where

θJA is the thermal impedance of the package.

The l denotes the specifications which apply over the specified operating

junction temperature range, otherwise specifications are at TA = 25°C (Note 2). VIN = 24V, VOUT = 5V, unless otherwise noted.

Note 3: Current measurements are performed when the LTC3114-1 is

not switching. The current limit values measured in operation will be

somewhat higher due to the propagation delay of the comparators. The

LTC3114-1 is tested in a proprietary non-switching test mode.

Note 4: This IC includes overtemperature protection that is intended to

protect the device during momentary overload conditions. The maximum

rated junction temperature will be exceeded when this protection is active.

Continuous operation above the specified absolute maximum operating

junction temperature may impair device reliability or permanently damage

the device.

Note 5: Operating output voltage can be programmed as low as 1.0V

nominal if the accurate programmable output current limit feature is not

required.

Note 6: Connecting LDO/PLDO to the regulated 5V output (bootstrapping),

reduces quiescent current substantially. Typical no-load quiescent current

for 12V VIN to 5V VOUT is 30µA, if boostrapped.

N-Channel Switch Resistance

Switch A (from PVIN to SW1)

Switch B (from SW1 to PGND)

Switch C (from SW2 to PGND)

Switch D (from PVOUT to SW2)

250

mΩ

N-Channel Switch Leakage

0.1

µA

LDO Output Voltage

ILDO = 10mA

4.2

4.4

4.6

LDO Load Regulation

ILDO = 1mA to 10mA

0.8

LDO Line Regulation

ILDO = 1mA, VIN = 10V to 40V

0.2

LDO Current Limit

VLDO = 2.5V

Soft-Start Time

SW1 and SW2 Forced Low Time

100

MODE Pin Logic Threshold

H = PWM Mode, L = Burst Mode Operation

0.5

0.9

1.3

LTC3534 Datasheet(PDF) 4 Page - Analog Devices

LTC3534 Datasheet(HTML) 4 Page - Analog Devices

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34

Datasheet Download

Link URL