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LM27262 Datasheet(PDF) 16 Page - National Semiconductor (TI) |
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LM27262 Datasheet(HTML) 16 Page - National Semiconductor (TI) |
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16 / 22 page ![]() Operation Descriptions (Continued) T SOFTSTART-RAMP =(VCORE/ISOFTCAP)CSOFTCAP; T VIDPGD =TSOFTSTART-RAMP x 0.5V/VCORE; T TURN-ON =TVIDPGD +(VCORE/ISOFTCAP)CSOFTCAP; where I SOFTCAP = 3.2µA and Volt, Amp and Farad units are used. For example: If T SOFTSTART-RAMP ) 5 msec for V CORE = 1.55V and Css = 10nF then T VIDPGD ) 1.6 msec and T TURN-ON = 6.6 msec. If T SOFTSTART-RAMP ) 3.6 msec for V CORE = 1.15V and Css = 10nF then T VIDPGD ) 1.6 msec and T TURN-ON = 5.2 msec SOFT STOP The soft-stop feature forces a well-controlled power off tran- sition. The output voltage ramps down smoothly, eliminating the possibility of a large negative voltage at the output. This feature eliminates the large need for a Schottky protection diode or a clamp transistor at the load. The LM27262 has an internal 50k Ω resistor connected to the SOFTCAP pin that discharges the SOFTCAP capacitor. The soft-stop ramp-down time is approx. 9msec with a 33nF capacitor, or approximately 5 x RC, where R is 50k Ω, and C is the soft-start capacitor. VID-CODE CONTROLLED V CORE TRANSITIONS The VID transition slew rate is set by an external resistor connected between the VIDSLEW and SOFTCAP pins. This permits an additional level of slew rate control beyond that provided by the soft-start function. UVP, OVP and OCP SHUTDOWN PROGRAMMABLE Delay If PWRGD is de-asserted for any reason, the voltage regu- lator can disable its output and latch itself off. Different systems can tolerate various fault conditions for different time durations. A programmable delay feature enables the system designer to chose how long the supply will wait following the detection of an OVP or UVP event prior to shutting down. By adding a capacitor to the DELAY pin, pin 34, the latching of fault events can be delayed. If the DELAY pin is grounded, latch off is defeated entirely. The following formula should be used for calculating a programming ca- pacitor value: CDELAY = TDELAY x 12.5µA/1.4V or TDELAY/112k Ω where C is in Farads, 1.4V is the “DELAY Threshold Voltage”, and 12.5µA is the “DELAY Charge Current”. For example, CDELAY = 0.22µF programs a 25ms delay. Grounding the DELAY pin will disable the latch off function. This can be most helpful during system de-bug or if the latch-off feature is not desired for some reason. 2-, 3- or 4-PHASE OPERATION 2-, 3- or 4-phase operation is user selectable. For lower current designs it may be desirable to use fewer than 4 phases. LOGIC INPUTS and OUTPUTS - GENERAL All logic control inputs have hysteresis that increases noise immunity and, particularly for the VRON signal, enables a designer to turn the LM27262 on from a 3.3V rail via an external RC-delay circuit. Note that the logic outputs are not short circuit protected and must not be short-circuited to either power rails or ground. LOOP COMPENSATION An RC network connected between the VFB and VCOMP pins compensates the feedback loop’s gain/phase charac- teristics. These two pins are respectively, the input and output of the error amplifier. Feedback loops such as these are best compensated through the use of an empirical ap- proach. The best approach is to measure the control to output transfer function and then design an appropriate error amplifier compensation. Component Selection POWER PATH COMPONENT SELECTION The choice of power path components is critical to achieving a properly behaved regulator. Design considerations usually include such things as efficiency, transient response, output ripple, size and cost. The process tends to be somewhat iterative while converging on a workable design. The first decision that must be made is the number of phases to use. The maximum load current that the design must deliver usually dictates this. With the power devices avail- able at the time of this writing, the practical upper limit is about 20 to 25 amps per phase. Trying to run higher per phase load currents results in thermal problems as well as the inability to maintain an all surface-mount design. In some instances, it is possible to pull higher phase currents if the peak’s duration is relatively short and the average current is well below peak. Another possible criteria for selecting the number of phases is to capitalize on the ripple current can- cellation effects of multiphase designs. In theory, at a V IN to V OUT ratio equal to the number of phases, the input and output ripple currents approach zero. If the design will run close to this “sweet spot” it may influence the number of phases selected. For instance, adding a phase may prove most advantageous. One’s initial reaction to increased phase count is that the solution becomes much more costly. But this assumption isn’t always correct. In theory, the total energy stored in the output inductors decreases as phases are added. This is due in part to the ripple cancellation effects and in part to the energy storage being a function of the square of the inductor currents. So for equal inductor values in a two-phase design, the energy stored is only 50% that of a single phase design. In practice, for equal output ripple, the inductance in each phase of a 2-phase design could be about 1⁄2 that of a comparable single phase design. Therefore, energy storage per inductor is only 25% that of a one phase design. So, although there may be two inductors in the 2-phase design, they are each much smaller, lighter and hopefully lower cost, than the comparable single-phase solution. As for MOSFET selection, since the total current being switched is the same regardless the number of phases, in theory, the total Rds(on) required is the same as well. It just gets split into more packages in the multi-phase design. Some difficult to char- acterize advantages of a higher phase count relate to MOS- FET parasitics. For instance, the body diode reverse recov- ery effects of the low side switch adversely effect the switching loses in a buck regulator. Larger FETs for both the low side and high side switches will have much greater losses than smaller devices switching lower currents. Spuri- ous turn-on of the low side FET due to its Miller capacitance is also less problematic in smaller devices. The result is that in many cases, the higher phase count design will prove to be somewhat more efficient than a lower phase count design that can provide comparable full load current. www.national.com 16 |
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