MAX17823BGCV datasheet(22/121 Pages) MAXIM

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MAX17823B

12-Channel High-Voltage Data Acquisition System

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Die Temperature Measurement

The die temperature measurement allows the host to compute the device temperature (TDIE) as it relates to the

acquisition accuracy and allows the device to automatically shut itself down when TDIE > 145°C. The measurement

employs a source whose voltage, VPTAT, is proportional to absolute temperature (PTAT) as shown in Figure 7. The

VPTAT measurement is enabled by setting DIAGSEL[2:0] to 0b110 and the 14-bit measurement is stored in

DIAG[15:2]. The die temperature measurement requires a settling time of 50us from the start of the measurement

cycle until the diagnostic conversion. As long as 2 or more cell measurements are enabled, there will be sufficient

settling time for this measurement. Refer to Figure 9 and Table 8 for a detailed view of this timing.

The PTAT voltage is computed as follows:

VPTAT = (DIAG[15:2] / 16384d) x VREF

Where VREF = 2.307V. The measured voltage may be converted into °C as follows:

TDIE (in °C) = (VPTAT / AV_PTAT) + TOS_PTAT - 273°C

Refer to the Electrical Characteristics Table for AV_PTAT and TOS_PTAT values.

Die Temperature Alert

The ALRTTEMP bit is updated at the end of each measurement cycle for which DIAGSEL[2:0] = 0b110. If

ALRTTEMP is set, it signifies that TDIE > TALRTTEMP or that the diagnostic measurement did not have sufficient settling

time (< 50µs) and therefore may not be accurate. If ALRTTEMP is set, the host should consider the possibility that

the acquisition does not meet the expected accuracy specification, or that the die temperature measurement itself

may be inaccurate due to insufficient settling time (< 2 cell measurements enabled).

MUX

ADC

VREF

VTHRM

AGND

ALRTTEMP

VPTAT

1.230V

Figure 7. Die Temperature Measurement

MAX17823BGCV Datasheet(PDF) 22 Page - Maxim Integrated Products

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