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TERMINAL FUNCTIONS

ABSOLUTE MAXIMUM RATINGS

(1)

THS1215

SLAS292A – MARCH 2001 – REVISED MARCH 2004

TERMINAL

I/O

DESCRIPTION

NAME

NO.

AGND

1, 7

I

Analog ground

8, 27

I

Analog supply

AIN+

5

I

Positive analog input

AIN-

6

I

Negative analog input

CLK

28

I

ADC conversion clock

CON1

2

I

Configuration input 1

CON0

3

I

Configuration input 0

DGND

19

I

Digital ground

20

I

Digital supply

D11

12

O

ADC data bit 11

D10

13

O

ADC data bit 10

D9

14

O

ADC data bit 9

D8

15

O

ADC data bit 8

D7

16

O

ADC data bit 7

D6

17

O

ADC data bit 6

D5

18

O

ADC data bit 5

D4

21

O

ADC data bit 4

D3

22

O

ADC data bit 3

D2

23

O

ADC data bit 2

D1

24

O

ADC data bit 1

D0

25

O

ADC data bit 0

EXTREF

4

I

Reference select input (high = external, low = internal)

OVRNG

11

O

Out of range indicator (high = out of range)

OE

26

I

Output enable (high = disable, low = enable)

REFT

9

I/O

Upper ADC reference voltage

REFB

10

I/O

Lower ADC reference voltage

over operating free-air temperature range (unless otherwise noted)

UNIT

–0.3 V to 4 V

Supply voltage range

AGND to DGND

–0.3 V to 0.3 V

Reference voltage input range, REFT, REFB to AGND

Analog input voltage range, AIN+, AIN– to AGND

Clock input voltage range, CLK to AGND

Digital input voltage range, digital input to DGND

Digital output voltage range, digital output to DGND

–40

°C to 150°C

–65

°C to 150°C

Lead temperature 1,6 mm (1/16 in) from case for 10 seconds

300

°C

(1)

Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating

conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

3