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MPC5643L Datasheet(PDF) 96 Page - NXP Semiconductors |
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MPC5643L Datasheet(HTML) 96 Page - NXP Semiconductors |
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96 / 136 page ![]() MPC5643L Microcontroller Data Sheet, Rev. 10 Electrical characteristics NXP Semiconductors 96 Figure 9. Transient Behavior during Sampling Phase In particular two different transient periods can be distinguished: • A first and quick charge transfer from the internal capacitance CP1 and CP2 to the sampling capacitance CS occurs (CS is supposed initially completely discharged): considering a worst case (since the time constant in reality would be faster) in which CP2 is reported in parallel to CP1 (call CP = CP1 + CP2), the two capacitances CP and CS are in series, and the time constant is Eqn. 5 Equation 5 can again be simplified considering only CS as an additional worst condition. In reality, the transient is faster, but the A/D converter circuitry has been designed to be robust also in the very worst case: the sampling time TS is always much longer than the internal time constant: Eqn. 6 The charge of CP1 and CP2 is redistributed also on CS, determining a new value of the voltage VA1 on the capacitance according to Equation 7: Eqn. 7 • A second charge transfer involves also CF (that is typically bigger than the on-chip capacitance) through the resistance RL: again considering the worst case in which CP2 and CS were in parallel to CP1 (since the time constant in reality would be faster), the time constant is: Eqn. 8 In this case, the time constant depends on the external circuit: in particular imposing that the transient is completed well before the end of sampling time TS, a constraints on RL sizing is obtained: Eqn. 9 VA VA1 VA2 t TS VCS Voltage Transient on CS ΔV < 0.5 LSB 1 2 τ1 < (RSW + RAD) CS << TS τ2 = RL (CS + CP1 + CP2) τ1 RSW RAD + () = CP CS • CP CS + --------------------- • τ1 RSW RAD + () < CS TS « • VA1 CS CP1 CP2 ++ () • VA CP1 CP2 + () • = τ2 RL < CS CP1 CP2 ++ () • 10 τ2 • 10 RL CS CP1 CP2 ++ () • • =TS < |
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