LPC1102 datasheet(21/43 Pages) NXP

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LPC1102_1104

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Product data sheet

Rev. 7 — 26 September 2013

21 of 43

NXP Semiconductors

LPC1102/1104

32-bit ARM Cortex-M0 microcontroller

[1]

The ADC is monotonic, there are no missing codes.

[2]

The differential linearity error (ED) is the difference between the actual step width and the ideal step width. See Figure 5.

[3]

The integral non-linearity (EL(adj)) is the peak difference between the center of the steps of the actual and the ideal transfer curve after

appropriate adjustment of gain and offset errors. See Figure 5.

[4]

The offset error (EO) is the absolute difference between the straight line which fits the actual curve and the straight line which fits the

ideal curve. See Figure 5.

[5]

The gain error (EG) is the relative difference in percent between the straight line fitting the actual transfer curve after removing offset

error, and the straight line which fits the ideal transfer curve. See Figure 5.

[6]

The absolute error (ET) is the maximum difference between the center of the steps of the actual transfer curve of the non-calibrated

ADC and the ideal transfer curve. See Figure 5.

[7]

Tamb = 25 C; maximum sampling frequency fs = 400 kSamples/s and analog input capacitance Cia = 1 pF.

[8]

Input resistance Ri depends on the sampling frequency fs: Ri = 1 / (fs  Cia).

Table 6.

ADC static characteristics

Tamb = 40 C to +85 C unless otherwise specified; ADC frequency 4.5 MHz, VDD = 2.5 V to 3.6 V.

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

VIA

analog input voltage

VDD

Cia

analog input capacitance

differential linearity error

[1][2] --

1LSB

EL(adj)

integral non-linearity

[3] --

1.5

LSB

offset error

[4] --

3.5

LSB

gain error

[5] --0.6

absolute error

[6] --

4LSB

Rvsi

voltage source interface

resistance

--40



input resistance

[7][8] --2.5



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