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451 Datasheet(PDF) 5 Page - 3M Electronics

Part # 451
Description  3M™ Ribbon Cable Wiremount Socket Assembly, 451 Series 3M™ Shrouded Boardmount Header Latch and Eject, 452 Series
PDF  9 Pages
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Manufacturer  3M [3M Electronics]
Direct Link  http://www.3m.com
Logo 3M - 3M Electronics

451 Datasheet(HTML) 5 Page - 3M Electronics

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78-5102-0091-4 Rev F
3M™ Ribbon Cable Socket and Header, 451 and 452 Series, 1.27mm (0.050") pitch
5 of 9
7. Physical Testing
8. Environmental Testing
EIA-364-13
Method B
Durability
(Full)
100(30µ"
Au, 4-30p)
Mating cycles
10 milliohm maximum ∆R contact resistance per
mated interface throughout testing.
EIA-364-13
Mating Force /
Contact
1.25
Newtons
(MAX)
Connector average/pin. Mated to a .0148" square pin
connector. Without friction bumps.
EIA-364-13
Method B
25(30µ" Au,
32-50p)
20(Flash Au)
Durability
(Preconditioning)
50 (4-30p)
25 (32-50p)
Mating cycles
10 milliohm maximum ∆R contact resistance per
mated interface throughout testing. (30µ"Au only)
Unmating Force /
Contact
0.4
Newtons
(MIN)
Connector average/pin. Mated to a .0148" square pin
connector. Without friction bumps.
EIA-364-18
Plating Thickness
Tin
5.08-10.2
(200-400)
Micro-meter
(Micro-inch)
Random measurements from any 3 lots shall not be
outside of specification.
EIA-364-48
Method C
EIA-364-13
Description or
parameter
Values &
limits
Units
Requirement or conditions
Test standard or
method
Plating Thickness
Nickel
1.27-3.81
(50-150)
Micro-meter
(Micro-inch)
Random measurements from any 3 lots shall not be
outside of specification.
Plating Thickness
Gold
0.76 min
(30)
Micro-meter
(Micro-inch)
Minimum of random measurements from any 3 lots
shall not be less than specified.
Visual
No defects such as deformation, blister, damage,
crack, etc.
Solderability
(Header)
As-received
hours
95 percent coverage of solderable area. No steam
age.
EIA-364-52
Description or
parameter
Values &
limits
Units
Requirement or conditions
Test standard or
method
Temperature Life
(Full)
1008
125
hours
°C
No physical abnormalities. 30 milliohm maximum ∆R
contact resistance throughout testing.*
EIA-364-17
Method A
Condition 5D
Thermal Shock
-65 to +125
°C
No physical abnormalities. 10 milliohm maximum ∆R
contact resistance per mated interface throughout
testing.*
EIA-364-32,
Table 2,
Condition II
Moisture Sensitivity
Level (Header)
260
°C
Level 1 (85°C / 85% RH, 168 hours), No defects such
as deformation, blister, damage, crack, etc., must
maintain dimensional stability.
J-STD-020E
Level 1 (MSL1)
°C cold shock
Mixed Flowing Gas
336
hours
Durability preconditioning: 50 cycles
Mated with wear: 336 hours
Tested on 30pin, 0.76 µm (30 µ") contact plating
EIA-364-65B
Class IIA
Humidity
Temperature
Cycling
10
Days
No physical abnormalities. 10 milliohm maximum ∆R
contact resistance per mated interface throughout
testing.
EIA-364-31,
Method III, Fig 1,
+25 to +65
°C
80 to 100
% RH
-10
*Temperature is primarily limited by cable specifications. Testing completed at 125°C with high temperature 3M™ FEP cables (3604, 3609). Temperature is
limited to 105°C when mated to 3M™ PVC or TPE cables (3754, 3447, 3749, 3756).
3M Electronics Materials Solutions Division
13011 McCallen Pass Bldg. C
Austin, TX 78753-5380
1-800-225-5373
www.3M.com/interconnect



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