AS2376Q

Document number: DS45184 Rev. 1 - 2

4 of 13

www.diodes.com

September 2022

© Diodes Incorporated

AS2376Q

Electrical Characteristics (Limits in standard typeface are for T

A = +25°C, bold typeface applies over -40°C to +125°C (Note 9),

RL = 10kΩ connected to VS / 2, VCM = VS / 2, and VOUT = VS / 2, unless otherwise noted.)

SYMBOL

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

OFFSET VOLTAGE

VOS

Input offset voltage

(Note 10)

-

-

5

25

μV

Long-term stability (Note 11)

-

-

60

μV

Package level shift (Note 12)

-

-

320

μV

ΔV

OS/ΔT

Input offset voltage versus

temperature

TA = -40°C to +85°C

-

0.26

1.2

μV/°C

TA = -40°C to +125°C

-

0.32

2

μV/°C

PSRR

Input offset voltage versus

power supply

TA = 25°C, VS = 2.2V to 5.5 V, VCM < (V

+) – 1.3 V

-

5

20

μV/V

TA = -40°C to +125°C

-

5

-

μV/V

VS = 2.2 V to 5.5 V, VCM < (V

+) – 1.3 V

-

Channel separation, dc

-

0.5

-

mV/V

INPUT BIAS CURRENT

IB

Input bias current

TA = 25°C

-

0.2

70

pA

TA = –40°C to +125°C

See Typical Characteristics

pA

IOS

Input offset current

-

0.2

70

pA

NOISE

-

-

Input voltage noise

f = 0.1 Hz to 10 Hz

-

0.8

-

μVPP

en

Input voltage noise

density

f = 1 kHz

-

9.5

-

nV/√Hz

In

Input current noise

f = 1 kHz

-

2

-

fA/√Hz

INPUT VOLTAGE RANGE

VCM

Common-mode voltage

range

-

(V

–) – 0.1

-

(V

+) + 0.1

V

CMRR

Common-mode rejection

ratio

(V

–) < V

CM < (V

+) – 1.3 V

76

90

dB

INPUT CAPACITANCE

-

Differential

-

-

6.5

-

pF

-

Common-mode

-

-

13

-

pF

OPEN-LOOP GAIN

AOL

Open-loop voltage gain

50 mV < VO < (V

+) – 50 mV, R

L = 10 kΩ

120

134

-

dB

100 mV < VO < (V

+) – 100 mV, R

L = 2 kΩ

120

126

-

dB

FREQUENCY RESPONSE CL = 100 pF, VS = 5.5 V

GBW

Gain-bandwidth product

-

-

5.5

-

MHz

SR

Slew rate

G = 1

-

2

-

V/μs

tS

Settling time

Settling to 0.1%, 2-V step , G = 1

-

1.6

-

μs

Settling to 0.01%, 2-V step , G = 1

-

2

-

μs

-

Overload recovery time

VIN × gain > VS

-

0.33

-

μs

-

Overload recovery time

VIN × gain > VS

-

0.33

-

μs

Notes:

9. Limits over the full temperature are guaranteed by design, but not tested in production.

10. After mounted to PCB, Vos value will be different to spec, the delta value depend on PCB solder stress, the max value is between +/- 80uV, per our

experiment.

11. AS2376Q, the long-term stability is defined as MAX. VOS shift during life HTOL 1000 hours with TA=+125°C.(Tj=150°C) This Vos drift with time is not a

linear function of time, and the shift is greater initially and diminishes over time. This parameter is guaranteed by design.

12. After HTSL 2000 hours with TA=+150°C, the Vos drift test condition is TA=+125°C