TLP151

4

2019-10-10

© 2019

Toshiba Electronic Devices & Storage Corporation

Switching Characteristics (Ta = −40 to 110 °C, unless otherwise specified)

Characteristics

Symbol

Test

Circuit

Test Condition

Min

Typ.

Max

Unit

Propagation delay time

L → H

tpLH

Figure

7

VCC = 30 V

Rg = 47 Ω

Cg = 3 nF

IF = 0 → 5 mA

100

―

700

ns

H → L

tpHL

IF = 5 → 0 mA

100

―

700

Output rise time (10−90 %)

tr

IF = 0 → 5 mA

―

50

―

Output fall time (90−10 %)

tf

IF = 5 → 0 mA

―

50

―

Switching time dispersion

between ON and OFF

| tpHL-tpLH |

IF = 0 ↔ 5 mA

―

―

500

Common mode transient immunity

at HIGH level output

CMH

Figure

8

VCM =1000 Vp-p

VCC = 30 V

Ta = 25 °C

IF = 5 mA

VO (min) = 26 V

−15

―

―

kV/μs

Common mode transient immunity

at LOW level output

CML

IF = 0 mA

VO (max) = 1 V

15

―

―

Note

: All typical values are at Ta = 25 °C.

Note

: A ceramic capacitor (0.1 μF) should be connected from pin 6 (VCC) to pin 4 (GND) to stabilize the operation of

the high gain linear amplifier. Failure to provide the bypass may impair the switching property.

The total lead length between capacitor and coupler should not exceed 1 cm.

Figure 1: IOPH Test Circuit

Figure 2: IOPL Test Circuit

Figure 3: VOH Test Circuit

Figure 4: VOL Test Circuit

Figure 5: ICCH Test Circuit

Figure 6: ICCL Test Circuit

A

IOPL

V5-4

VCC

1

3

4

6

0.1 μF

V

VCC

VO

IF

3

4

6

IO

0.1 μF

VOL

VCC

V

VF

1

3

4

6

IO

0.1 μF

VCC

A

ICCH

3

4

6

0.1 μF

VCC

A

ICCL

1

3

4

6

0.1 μF

A

IF

1

3

4

6

IOPH

V6-5

VCC

0.1 μF

IF

*VOH =VCC-VO

5

5

5

5

5

5