Philips Semiconductors FAST Products

Product specification

74F8962/8963

9-Bit latched bidirectional Futurebus transceivers

(open-collector)

March 11, 1993

7

DC ELECTRICAL CHARACTERISTICS

(Over recommended operating free-air temperature range unless otherwise noted.)

SYMBOL

PARAMETER

TEST

LIMITS

UNIT

MIN

MAX

High-level output current

B0 – B8

100

µA

Power-off output current

B0 – B8

100

µA

High-level output voltage

2.5

V

0.50

V

Low-level output voltage

B0 – B8

0.75

1.0

1.10

V

0.40

V

Input clamp voltage

-1.2

V

Input current at

maximum input voltage

OEAB, OEBA,

LEAB, LEBA,

AI0 – AI8

100

µA

B0 – B8

1

mA

High-level input current

OEAB, OEBA,

LEAB, LEBA,

AI0 – AI8

20

µA

B0 – B8

100

µA

Low-level input current

OEAB, OEBA,

LEAB, LEBA,

AI0 – AI8

–100

µA

B0 – B8

–100

µA

Off state output current,

high-level voltage applied

AO0 – AO8

50

µA

Off state output current,

low-level voltage applied

–50

µA

Short circuit output

AO0 –

AO8

’F8960

74F8962

OEAB = 2.7V

-60

-150

mA

only

74F8963

OEAB = 2.7V

80

110

mA

Supply current (total)

105

145

mA

80

110

mA

NOTES TO DC ELECTRICAL CHARACTERISTICS

1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.

techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting

of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any