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HCPL-5501 Datasheet(PDF) 9 Page - Agilent(Hewlett-Packard) |
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HCPL-5501 Datasheet(HTML) 9 Page - Agilent(Hewlett-Packard) |
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9 / 14 page  9 Notes: 1. Each channel of a multi-channel device. 2. Current Transfer Ratio is defined as the ratio of output collector current, IO, to the forward LED input current, IF, times 100%. CTR is known to degrade slightly over the unit’s lifetime as a function of input current, temperature, signal duty cycle, and system on time. Refer to Application Note 1002 for more detail. ln short, it is recommended that designers allow at least 20-25% guardband for CTR degradation. 3. All devices are considered two-terminal devices; measured between all input leads or terminals shorted together and all output leads or terminals shorted together. 4. The 4N55, 4N55/883B, HCPL-257K, HCPL- 6530, HCPL-6531, and HCPL-653K dual channel parts function as two independent single channel units. Use the single channel parameter limits. IF = 0 mA for channel under test and IF = 20 mA for other channels. 5. Measured between adjacent input pairs shorted together for each multichannel device. Typical Characteristics All typical values are at TA = 25°C, VCC = 5 V, unless otherwise specified. 6. tPHL propagation delay is measured from the 50% point on the leading edge of the input pulse to the 1.5 V point on the leading edge of the output pulse. The tPLH propagation delay is measured from the 50% point on the trailing edge of the input pulse to the 1.5 V point on the trailing edge of the output pulse. 7. CML is the maximum rate of rise of the common mode voltage that can be sustained with the output voltage in the logic low state (VO < 0.8 V). CMH is the maximum rate of fall of the common mode voltage that can be sustained with the output voltage in the logic high state (VO > 2.0 V). 8. Bandwidth is the frequency at which the ac output voltage is 3 dB below the low frequency asymptote. For the HCPL-5530 the typical bandwidth is 2 MHz. 9. This is a momentary withstand test, not an operating condition. 10. Higher CTR minimums are available to support special applications. 11. Measured between each input pair shorted together and all output connections for that channel shorted together. 12. Standard parts receive 100% testing at 25°C (Subgroups 1 and 9). SMD and 883B parts receive 100% testing at 25, 125, and -55°C (Subgroups 1 and 9, 2 and 10, 3 and 11, respectively). 13. Not required for 4N55, 4N55/883B, HCPL- 257K, 5962-8767901, and 5962-8767905 types. 14. Required for 4N55, 4N55/883B, HCPL-257K, 5962-8767901, and 5962-8767905 types only. Parameter Symbol Test Conditions Typ. Units Fig. Notes Input Capacitance CIN VF = 0 V, f = 1 MHz 60 pF 1 Input Diode Temperature Coefficient ∆V F/ ∆T A IF = 20 mA -1.5 mV/°C 1 Resistance (Input-Output) RI-O VI-O = 500 V 1012 Ω 3 Capacitance (Input-Output) CI-O f = 1 MHz 1.0 pF 1, 11 Transistor DC Current Gain hFE VO = 5 V, IO = 3 mA 250 - 1 Small Signal Current Transfer Ratio ∆I O/ ∆I F VCC = 5 V, VO = 2 V 21 % 7 1 Common Mode Transient Immunity at Logic High Level Output |CMH|IF = 0 mA, RL = 8.2 k Ω, VO (min) = 2.0 V, VCM = 10 VP-P 1000 V/ µs10 1, 7 Common Mode Transient Immunity at Logic Low Level Output |CML|IF = 16 mA, RL = 8.2 k Ω, VO (max) = 0.8 V, VCM = 10 VP-P -1000 V/ µs10 1, 7 Bandwidth BW 9 MHz 8 8 Multi-Channel Product Only Parameter Symbol Test Conditions Typ. Units Notes Input-Input Insulation Leakage Current II-I RH ≤ 65%, V I-I = 500 V, t = 5 s 1 pA 5, 9 Resistance (Input-Input) RI-I VI-I = 500 V 1012 Ω 5 Capacitance (Input-Input) CI-I f=1 MHz 0.8 pF 5 |
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