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ADC081000LEVAL Datasheet(PDF) 1 Page - National Semiconductor (TI) |
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ADC081000LEVAL Datasheet(HTML) 1 Page - National Semiconductor (TI) |
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1 / 29 page  ADC081000 High Performance, Low Power 8-Bit, 1 GSPS A/D Converter General Description The ADC081000 is a low power, high performance CMOS analog-to-digital converter that digitizes signals to 8 bits resolution at sampling rates up to 1.6 GSPS. Consuming a typical 1.4 Watts at 1 GSPS from a single 1.9 Volt supply, this device is guaranteed to have no missing codes over the full operating temperature range. The unique folding and interpolating architecture, the fully differential comparator design, the innovative design of the internal sample-and- hold amplifier and the self-calibration scheme enable a very flat response of all dynamic parameters beyond Nyquist, producing a high 7.5 ENOB with a 500 MHz input signal and a 1 GHz sample rate. Output formatting is offset binary and the LVDS digital outputs are compliant with IEEE 1596.3- 1996, with the exception of a reduced common mode volt- age of 0.8V. The converter has a 1:2 demultiplexer that feeds two LVDS buses, reducing the output data rate on each bus to half the sampling rate. The data on these buses are interleaved in time to provide a 500 MHz output rate per bus and a com- bined output rate of 1 GSPS. The converter typically consumes less than 10 mW in the Power Down Mode and is available in a 128-lead, thermally enhanced exposed pad LQFP and operates over the indus- trial (-40˚C ≤ T A ≤ +85˚C) temperature range. Features n Internal Sample-and-Hold n Single +1.9V ±0.1V Operation n Adjustable Output Levels n Guaranteed No Missing Codes n Low Power Standby Mode Key Specifications n Resolution 8 Bits n Max Conversion Rate 1 GSPS (min) n ENOB @ 500 MHz Input 7.5 Bits (typ) n DNL ±0.25 LSB (typ) n Conversion Latency 7 and 8 Clock Cycles n Power Consumption — Operating 1.45 W (typ) — Power Down Mode 9 mW (typ) Applications n Direct RF Down Conversion n Digital Oscilloscopes n Satellite Set-top boxes n Communications Systems n Test Instrumentation Block Diagram 20068153 July 2004 © 2004 National Semiconductor Corporation DS200681 www.national.com |
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