IDT7035SSLASHL datasheet(6/19 Pages) IDT

6 / 19 page

6.42

IDT7035S/L

High-Speed 8K x 18 Dual-Port Static RAM

Industrial and Commercial Temperature Ranges

AC Test Conditions

Figure 2. Output Test Load

( for tLZ, tHZ, tWZ, tOW)

* including scope and jig.

Data Retention Waveform

Data retention Characteristics Over All Temperature Ranges

(L Version Only) (VLC = 0.2V, VHC = VCC - 0.2V)(4)

NOTES:

1. TA = +25°C, VCC = 2V, not production tested.

2. tRC = Read Cycle Time

3. This parameter is guaranteed by characterization, but is not production tested.

4. At Vcc < 2.0V input leakages are undefined.

Figure 1. AC Output Test Load

DATA RETENTION MODE

VCC

4088 drw 03

4.5V

tCDR

VIH

VDR

VIH

4.5V

VDR

≥

4088 drw 04

893

Ω

30pF

347

Ω

DATAOUT

BUSY

INT

893

Ω

5pF*

347

Ω

DATAOUT

Input Pulse Levels

Input Rise/Fall Times

Input Timing Reference Levels

Output Reference Levels

Output Load

GND to 3.0V

5ns Max.

1.5V

Figures 1 and 2

4088 tbl 11

Symbol

Parameter

Test Condition

Min.

Typ.(1)

Max.

Unit

VDR

VCC for Data Retention

VCC = 2V

2.0

___

ICCDR

Data Retention Current

> VHC

VIN > VHC or < VLC

IND.

___

100

4000

µA

COM'L.

___

100

1500

tCDR(3)

Chip Deselect to Data Retention Time

SEM

> VHC

___

tR(3)

Operation Recovery Time

tRC(2)

___

4088 tbl 10

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