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BR211-240 Datasheet(PDF) 3 Page - NXP Semiconductors |
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BR211-240 Datasheet(HTML) 3 Page - NXP Semiconductors |
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3 / 7 page ![]() Philips Semiconductors Product specification Breakover diodes BR211 series DYNAMIC CHARACTERISTICS T j = 25 ˚C unless otherwise stated SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT dV D/dt Linear rate of rise of off-state V (DM) = 85% V(BR)min; Tj = 70 ˚C - - 2000 V/ µs voltage that will not trigger any device C j Off-state capacitance V D = 0 V; f = 1 kHz to 1 MHz - - 100 pF Fig.1. Definition of breakover diode characteristics. Fig.2. Test waveform for high voltage impulse (I TSM1) according to CCITT vol IX-Rec K17. Fig.3. Maximum permissible non-repetitive on-state current based on sinusoidal currents; f = 50 Hz; device triggered at the start of each pulse; T j = 70˚C prior to surge. Fig.4. Normalised avalanche breakdown voltage V (BR) and V (BO) as a function of temperature. VT IT IH V(BO) IS ID VD current voltage Symbol V(BR) I(BR) Symmetric BOD 1 10 100 1000 10000 0 5 10 15 20 BR211 Number of impulses ITSM / A I ITSM2 time 100% 90% 50% 30% ITSM 10us 700us time current 0 -40 -20 0 20 40 60 80 100 Tj / C V(BR)(Tj) 1.06 1.04 1.02 1.00 0.98 0.96 0.94 0.92 0.90 V(BR)(25 C) August 1996 3 Rev 1.200 |
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