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CS5535 Datasheet(PDF) 169 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Part # CS5535
Description  Geode??CS5535 I/O Companion Multi-Function South Bridge
PDF  555 Pages
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Manufacturer  NSC [National Semiconductor (TI)]
Direct Link  http://www.national.com
Logo NSC - National Semiconductor (TI)

CS5535 Datasheet(HTML) 169 Page - National Semiconductor (TI)

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Revision 0.8
169
www.national.com
4.18 FLASH CONTROLLER
The CS5535 has a Flash device interface that supports
popular NOR Flash and inexpensive NAND Flash devices.
This interface is shared with the IDE interface (ATA-5 Con-
troller (ATAC)), using the same balls. NOR or NAND Flash
may co-exist with IDE devices using PIO (Programmed I/O)
mode. The 8-bit interface supports up to four “lanes” of
byte-wide Flash devices through use of four independent
chip selects, and allows for booting from the array. Hard-
ware support is present for SmartMedia-type ECC (Error
Correction Code) calculations, off-loading software from
having to support this task.
Features
• Supports popular NOR Flash and inexpensive NAND
Flash devices on IDE interface. No extra pins needed.
• NOR Flash and NAND Flash co-exist with IDE devices
with PIO (Programmed I/O) only mode.
• General purpose chip select pins support on-board ISA-
like slave devices.
• Programmable timing supports a variety of Flash
devices.
• Supports up to four byte-wide NOR Flash devices.
— Address up to 256 kB boot ROMs using an external
octal latch.
— Address up to 256 MB linear Flash memory arrays
using external latches.
— Boot ROM capability.
— Burst mode capability (DWORD read/write on PCI
bus).
• Supports up to four byte-wide NAND Flash devices.
— Hardware support for SmartMedia-type ECC (Error
Correction Code) calculation off-loading software
effort.
• Supports four programmable chip select pins with
memory or I/O addressable.
— Up to 1 kB of address space without external latch.
4.18.1 NAND Flash Controller
To understand the functioning of the NAND Flash Control-
ler, an initialization sequence and a read sequence is pro-
vided in the following sub-sections. The NAND Flash
Controller’s registers can be mapped to memory or I/O
space. The following example is based on memory
mapped registers.
4.18.1.1 Initialization
1)
Program MSR_LBAR_FLSH0 (MSR 51400010h) to
establish
a
base
address
(NAND_START)
and
whether in memory or I/O space. The NAND Controller
is memory mapped in this example and always occu-
pies 4 kB of memory space.
2)
Set the NAND timing MSRs to the appropriate values
(MSRs 5140001Bh and 5140001Ch).
4.18.1.2 Read
1)
Allocate a memory buffer. Start at address BAh in sys-
tem memory.
2)
Fill the buffer with the following values:
– BA: 02h (Assert CE#, CLE)
– BA + 1: 00h (Command: Read mode)
– BA + 2: 04h (Assert CE#, ALE, De-assert CLE)
– BA + 3: CA (Start column address)
– BA + 4: 04h
– BA + 5: PA0 (Page address byte 0)
– BA + 6: 04h
– BA + 7: PA1 (Page address byte 1)
– BA + 8: 04h
– BA + 9: PA2 (Page address byte 2)
– BA + 10: 08h (Assert CE#, De-assert ALE, Enable
Interrupt)
3)
For (i = 0; i < 11; i++), write the data in buffer [BA+i] to
memory location [NAND_START + 800h + i]. Generate
the command and address phase on the NAND Flash
interface.
4)
NAND Flash device may pull down the RDY/BUSY#
signal at this point. Software sets the EN_INT bit and
waits for the interrupt.
5)
Memory
byte
writes
03h
to
memory
location
[NAND_START + 815h] to clear ECC parity and
Enable ECC engine.
6)
For (i = 0; i < 256; i++), read data from [NAND_START
+ i] to buffer [BA + i] (read data from NAND Flash to
memory buffer. Can use DWORD read to save time).
7)
Memory DWORD Reads [NAND_START + 810h] to
get ECC parity [ECC0] of first 256 byte data.
8)
Memory
byte
writes
03h
to
memory
location
[NAND_START + 815h] to clear ECC parity and
enable ECC engine.
9)
For (i = 256; i < 512; i++), read data from
[NAND_START + i] to buffer [BA + i] (read data from
NAND Flash to memory buffer. Can use DWORD read
to save time).
10) Memory DWORD reads [NAND_START + 810h] to get
ECC parity [ECC1] of second 256 byte data.
11) For (i = 512; i < 528; i++), read data from
[NAND_START + i] to buffer [BA + i] (read data from
NAND Flash redundant data to memory buffer. Can
use DWORD read to save time).
12) Write 01h to memory location [NAND_START + 800h]
(de-assert CE#, NAND Flash enters to Idle state).
13) Retrieve ECC parity data from redundant data area
and compare them to ECC0 and ECC1.
14) Correct data if data error is detected and can be fixed.
Figure 4-56 on page 170 shows a basic NAND read cycle.



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