UG Series

5–7

Rev. B

–

–

–

–

P = 0 + 0.5 + 22 = 22.5 mW

Typical ULC Test Conditions

For AC specification purposes, an improved output

loading scheme has been defined for Atmel Wireless &

Microcontrollers high-drive (24 mA), high-speed ULC

devices. The schematic below (Figure 5.) describes the

typical conditions for testing these ULC devices, using

the standard loading scheme commonly available on

high-end ATE.

Compared to a no-load condition, this provides the

following advantages:

D Output load is more representative of “real life”

conditions during transitions.

D Transient energy is absorbed at the end of the line to

prevent reflections which would lead to inaccurate

ATE measurements.

Figure 5. Typical ULC Test Conditions

D.U.T.

12 mA

12 mA

1.5 V

Comp