G52197-0, Rev. 4.0

© VITESSE SEMICONDUCTOR CORPORATION

Page 1

8/19/00

741 Calle Plano, Camarillo, CA 93012 • 805/388-3700 • FAX: 805/987-5896

VITESSE

SEMICONDUCTOR CORPORATION

Data Sheet

VSC6250

1Gb/s 16-Channel

Drive-Side Deskew IC

Features

Applications

General Description

The VSC6250 is intended for use in the next generation of high-speed, high-accuracy memory testers for

devices such as Direct RAMBUS DRAM, SLDRAM, DDR SDRAM, and fast SSRAM.

The VSC6250 provides ultra-precise timing to allow next generation memory testers to achieve excellent

overall timing accuracy. Timing delays of the VSC6250 are extremely stable with respect to temperature and

voltage. Proprietary circuit design and process technology reduce pattern, data, frequency, and duty-cycle

dependencies to an absolute minimum. The VSC6250 requires no external DACs, which eliminates errors due

to DAC reference noise and analog crosstalk, and DAC temperature and voltage drift. The VSC6250 is avail-

able in a 128-pin PQFP, 14x20mm thermally-enhanced package.

• Wide Span: > 4ns Usable Range

• Pulse Width Adjustment to Compensate for

Dispersion in Pin Electronics:

± 2ns Independent Adjustment of Rising and

Falling Edges

• Fully Digital Single-Chip Solution:

No Off-Chip DACs Required

No DAC-Induced Timing Errors from Analog

Crosstalk, Reference Noise, Temperature, or

Voltage Drift

• Single Power Supply: -2V @ 5W

• 128-Pin PQFP, 14x20mm Thermally-

Enhanced Package

• High-Speed Operation:

1 Gb/s Data Rate

500ps min Output Pulse Width

750ps min Input Pulse Width

• Excellent Overall Timing Accuracy:

Ultra-Stable Timing Delays

Minimum Pattern Dependence

Very Fine Timing Resolution (1 LSB = 8ps)

• High Level of Integration Reduces Board Area:

16 Independently Adjustable Delay Lines in a

Single Package

• Configurable as 2 1:8 or 1:16

• High-Speed Instrumentation: Pulse Generators,

Timing Margin Testers for Datalink, Interface,

and Disk Drive Applications

• Telecom, Datacom, and Computer Deskew

• Drive-Side Deskew in High-Speed Memory

Testers

• Direct RAMBUS DRAM, SLDRAM, DDR

SDRAM, Fast SSRAM