VV6501 datasheet(55/60 Pages) STMICROELECTRONICS

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VV6501

Defect Categorisation

8.6

Physical aberrations

Silicon surface irregularities and external marks, both pits and deposits, on the package glass lids

can cause a deterioration in image quality. STMicroelectronics recognize that this could

compromise the product quality and therefore have introduced a specific test algorithm to identify

and reject samples that display these phenomena. The pass/fail criteria for this test are given in

Section 8.6.1.

8.6.1

Test details

The test defines 2 areas:

A small area: 9 by 9 pixels with pixel under test at the centre of this area (shaded blue in

Figure 35)

A large region, 31 by 31 pixels (shaded red in

Figure 35)

An average value is calculated for both the ‘small’ and ‘large’ areas.The areas then scan across the

whole array so that every pixel is evaluated. Due to the nature of the test, only the red pixels are

used. The next stage of the test is the creation of a pixel map with the coordinates of the failing

pixels. A pixel location is identified as a fail in the map if it satisfies the criteria outlined in

Table 26

below.

Figure 35: Test area definition

VV6501 Datasheet(PDF) 55 Page - STMicroelectronics