VV6501 datasheet(51/60 Pages) STMICROELECTRONICS

51 / 60 page

51/60

VV6501

Defect Categorisation

8.1

Introduction

Two distinct categories of defects are discussed in this section:

Pixel defects (

Section 8.2 - Section 8.5)

Physical aberrations (

Section 8.6)

The two categories differ in terms of test methodology as explained below.

8.2

Pixel defects

All packaged CMOS image sensors can contain impurities, either silicon faults, optical blemishes or

external dirt particles which can be introduced in the product at various stages of the manufacturing

process. These impurities can result in pixel defects, that is a pixel whose output is not consistent

with the level of incident light falling on the image sensor. Precise definitions of the type of pixel

defect tested by STMicroelectronics are outlined below. The ability to identify and correct these

defects is central to both the design requirements and quality certification, via test of

STMicroelectronics sensor products.

STMicroelectronics produces a number of hardware co-processors and software drivers that

implement defect correction algorithms. The defect correction algorithms ensure that the VV6501

sensor in conjunction with a companion STMicroelectronics co-processor will produce a high quality

final image.

VV6501 Datasheet(PDF) 51 Page - STMicroelectronics