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DSP56371 Datasheet(PDF) 33 Page - Freescale Semiconductor, Inc |
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DSP56371 Datasheet(HTML) 33 Page - Freescale Semiconductor, Inc |
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33 / 68 page ![]() Maximum Ratings DSP56371 Data Sheet, Rev. 4.1 Freescale Semiconductor 33 3.13 JTAG/OnCE Interface 4 Maximum Ratings CAUTION This device contains circuitry protecting against damage due to high static voltage or electrical fields. However, normal precautions should be taken to avoid exceeding maximum voltage ratings. Reliability of operation is enhanced if unused inputs are pulled to an appropriate logic voltage level (for example, either GND or VDD). The suggested value for a pull-up or pull-down resistor is 4.7 k Ω. NOTE In the calculation of timing requirements, adding a maximum value of one specification to a minimum value of another specification does not yield a reasonable sum. A maximum specification is calculated using a worst case variation of process parameter values in one direction. The minimum specification is calculated using the worst case for the same parameters in the opposite direction. Therefore, a “maximum” value for a specification will never occur in the same device that has a “minimum” value for another specification; adding a maximum to a minimum represents a condition that can never exist. Table 13. JTAG/OnCE Interface Signal Name Signal Type State during Reset Signal Description TCK Input Input Test Clock—TCK is a test clock input signal used to synchronize the JTAG test logic. It has an internal pull-up resistor. Internal Pull up resistor. This input is 5 V tolerant. TDI Input Input Test Data Input—TDI is a test data serial input signal used for test instructions and data. TDI is sampled on the rising edge of TCK and has an internal pull-up resistor. Internal Pull up resistor. This input is 5 V tolerant. TDO Output Tri-state Test Data Output—TDO is a test data serial output signal used for test instructions and data. TDO is tri-statable and is actively driven in the shift-IR and shift-DR controller states. TDO changes on the falling edge of TCK. TMS Input Input Test Mode Select—TMS is an input signal used to sequence the test controller’s state machine. TMS is sampled on the rising edge of TCK and has an internal pull-up resistor. Internal Pull up resistor. This input is 5 V tolerant. |
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