Analog Integrated Circuit Device Data

Freescale Semiconductor

15

33199

TYPICAL APPLICATIONS

Figure 25. Typical Application with Several ECUs

Figure 26. Test Circuit for Transient Schaffner Pulses

Test pulses are directly applied to VS and via a capacitor of 1nF to DIA and L. The voltage VS is limited to -2V/38V by the

transient suppressor diode D1. Pulses can occor simultaneously or separately.

MCU

MC33199

E.C.U # 1

MCU

E.C.U # 2

CAR

+Vbat

L Line

K Line

Fig 6 : Typical application with several ECUs

CAR ISO DIAGNOSTIC CONNECTOR

SERVICE TESTER

checking system

End of Line

programmation or

manufacturer

or

Other ECUs

MC33199

+12V

I1

DIA

GND

VBAT

L

Schaffner

Generator

2x1nF

2x330pF

100nF

D2

D1