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ADN2913 Datasheet(PDF) 32 Page - Analog Devices

Part # ADN2913
Description  Continuous Rate 6.5 Mbps to 8.5 Gbps Clock and Data Recovery IC with Integrated Limiting Amp/EQ
PDF  35 Pages
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Manufacturer  AD [Analog Devices]
Direct Link  http://www.analog.com
Logo AD - Analog Devices

ADN2913 Datasheet(HTML) 32 Page - Analog Devices

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ADN2913
Data Sheet
Rev. B | Page 32 of 35
Choosing AC Coupling Capacitors
AC coupling capacitors at the inputs (PIN, NIN) and outputs
(DATOUTP, DATOUTN) of the ADN2913 must be chosen
such that the device works properly over the full range of data
rates used in the application. When choosing the capacitors, the
time constant formed with the two 50 Ω resistors in the signal
path must be considered. When a large number of consecutive
identical digits (CIDs) are applied, the capacitor voltage can
droop due to baseline wander (see Figure 32), causing pattern
dependent jitter (PDJ).
The user must determine how much droop is acceptable and
choose an ac coupling capacitor based on that amount of droop.
The amount of PDJ can then be approximated based on the
capacitor selection. The actual capacitor value selection may
require some trade-offs between droop and PDJ.
For example, assuming that 2% droop is acceptable, the
maximum differential droop is 4%.
Normalizing to V p-p,
Droop = Δ V = 0.04 V = 0.5 V p-p (1 − e−t/τ)
Therefore,
τ = 12t
where:
τ is the RC time constant (C is the ac coupling capacitor, R = 100 Ω
seen by C).
t is the total discharge time.
t = nΤ
where:
n is the number of CIDs.
T is the bit period.
Calculate the capacitor value by combining the equations for τ
and t.
C = 12nT/R
When the capacitor value is selected, the PDJ can be
approximated as
PDJps p-p = 0.5tR(1 − e(−nT/RC)/0.6
where:
PDJps p-p is the amount of pattern dependent jitter allowed,
<0.01 UI p-p typical.
tR is the rise time, which is equal to 0.22/BW; BW ≈ 0.7 (bit rate).
Note that this expression for tR is accurate only for the inputs.
The output rise time for the ADN2913 is ~30 ps regardless of
data rate.
NOTES
1. DURING THE DATA PATTERNS WITH HIGH TRANSITION DENSITY, THE DIFFERENTIAL DC VOLTAGE AT V1 AND V2 IS ZERO.
2. WHEN THE TIA OUTPUTS CONSECUTIVE IDENTICAL DIGITS, V1 AND V1b ARE DRIVEN TO DIFFERENT DC LEVELS. V2 AND V2b DISCHARGE TO
THE VREF LEVEL, WHICH EFFECTIVELY INTRODUCES A DIFFERENTIAL DC OFFSET ACROSS THE AC COUPLING CAPACITORS.
3. WHEN THE BURST OF DATA STARTS AGAIN, THE DIFFERENTIAL DC OFFSET ACROSS THE AC COUPLING CAPACITORS IS APPLIED TO THE
INPUT LEVELS, CAUSING A DC SHIFT IN THE DIFFERENTIAL INPUT. THIS SHIFT IS LARGE ENOUGH SUCH THAT ONE OF THE STATES, EITHER
HIGH OR LOW, DEPENDING ON THE LEVELS OF V1 AND V1b WHEN THE TIA BEGAN DETECTING AND OUTPUTTING A CID DATA SYSTEM, IS CANCELLED OUT.
THE QUANTIZER DOES NOT RECOGNIZE THIS AS A VALID STATE.
4. THE DC OFFSET SLOWLY DISCHARGES UNTIL THE DIFFERENTIAL INPUT VOLTAGE EXCEEDS THE SENSITIVITY OF THE ADN2913. THE
QUANTIZER RECOGNIZES BOTH HIGH AND LOW STATES AT THIS POINT.
V1
V1b
V2
V2b
VDIFF
VDIFF = V2 – V2b
VTH = ADN2913 QUANTIZER THRESHOLD
2
34
1
VREF
VTH
CDR
VREF
50Ω
50Ω
PIN
NIN
ADN2913
COUT
DATOUTP
DATOUTN
CIN
V2
V2b
V1
V1b
TIA
VCC
2
Figure 32. Example of Baseline Wander



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