OP484S

ASD0012518 Rev. I | Page 5 of 5

Table III - Life Test Endpoint and Delta Parameter

(Product is tested in accordance with Table II with the following exceptions)

Parameter

Symbol

Sub-

groups

Burn In

Limit

Min

Burn In

Limit

Max

Life Test

Limit

Min

Life Test

Limit

Max

Life Test

Delta

Units

Input Offset Voltage

VS = ±15V

VOS

1

500

750

±250

µV

2, 3

1000

Input Bias Current

VS = ±15V

IB

1

450

550

±100

nA

2, 3

775

Input Offset Current

VS = ±15V

IOS

1

60

100

±40

nA

2, 3

100

Input Offset Voltage

VS = +5V

VOS

1

300

450

µV

2, 3

650

5.0

Life Test/Burn-In Information

5.1

HTRB is not applicable for this drawing.

5.2

Burn-in is per MIL-STD-883 Method 1015 test condition B or C.

5.3

Steady state life test is per MIL-STD-883 Method 1005.

Rev

Description of Change

Date

A

Initiate

April 01, 2001

B

Update web address

Jan. 25, 2002

C

Add radiation part number. Update web address

Feb. 10, 2003

D

Update header/footer and add to 1.0 scope description.

March 5, 2008

E

Add Junction Temperature (TJ)....+150°C to 3.3-Absolute Max Ratings section & aligned/centered

Table II

April 3, 2008

F

Updated Section 4.0c note to indicated pre-screen temp testing being performed.

June 5 2009

G

Updated fonts and size to ADI standards. Touched up die picture for clarity.

Oct 3, 2011

H

VOH (min) Limit Change for VS = +5V, Vcm = 2.5V at Table I and Table II.

Feb 15, 2018

I

Average Input Offset Voltage Drift Change at Table II

March 14, 2022

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03/22