OP484S

ASD0012518 Rev. I | Page 2 of 5

3.3

Absolute Maximum Ratings 1/

Supply Voltage .......................................................................................

±18V

Differential Input Voltage ........................................................................

±0.6V

Input Voltage

....................................................................................... ±18V

Output Short Circuit Duration .................................................................

Indefinite

Storage Temperature Range .................................................................

-65

°C to +150°C

Operating Temperature Range ..............................................................

-55

°C to +125°C

Junction Temperature (TJ).............................................................. .........

+150°C

Absolute Maximum Ratings Notes:

1/

Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels

may degrade performance and affect reliability.

4.0

Die Qualification

In accordance with class-K version of MIL-PRF-38534, Appendix C, Table C-II, except as

modified herein.

(a) Qual Sample Size and Qual Acceptance Criteria – 10/0

(b) Qual Sample Package – DIP

(c) Pre-screen electrical test over temperature performed post-assembly prior to die qualification.

Table I - Dice Electrical Characteristics

Parameter

Symbol

Conditions

1/

Limit

Min

Limit

Max

Units

VS = +5V, VCM = 2.5V

Input Offset Voltage

VOS

200

µV

Input Offset Current

IOS

2/

50

nA

Input Bias Current

IB

2/

350

nA

Input Voltage Range

IVR

1

4

V

Common Mode Rejection Ratio

CMRR

VCM = IVR

86

dB

Output High Voltage

VOH

IL = 1mA

4.8

V

Output Low Voltage

VOL

IL = 1mA

125

mV

Large Signal Voltage Gain

AVO

RL ≥ 2kΩ

VOUT = 1V to 4V

50

V/mV

Supply Current 3/

ISY

VOUT = 2.5V

5.8

mA

VS = ±15V, VCM = 0V

Input Offset Voltage

VOS

150

µV

Input Offset Current

IOS

50

nA

Input Bias Current

IB

350

nA