RH1014M

4

Rev. I

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TYPICAL PERFORMANCE CHARACTERISTICS

TOTAL DOSE BIAS CIRCUIT

TABLE 2: ELECTRICAL TEST REQUIREMENTS

MIL-PRF-38535 TEST REQUIREMENTS

SUBGROUP

Final Electrical Test Requirements

1*, 2, 3, 4, 5, 6

Group A Test Requirements

1, 2, 3, 4, 5, 6

Group C End Point Electrical Parameters

1, 2, 3

Group D End Point Electrical Parameters

1, 2, 3

Group E End Point Electrical Parameters

1

* PDA applies to subgroup 1. See PDA Test Notes.

PDA Test Notes

The PDA is specified as 5% based on failures from group A, subgroup 1,

tests after cooldown as the final electrical test in accordance with method

5004 of MIL-STD-883. The verified failures of group A, subgroup 1, after

burn-in divided by the total number of devices submitted for burn-in in

that lot shall be used to determine the percent for the lot.

Analog Devices, Inc., reserves the right to test to tighter limits than those

given.

Final Electrical Test Requirements (Method 5004)

1*,2,3,4,5,6

Group A Test Requirements (Method 5005)

1,2,3,4,5,6

Group B and D for Class S

1,2,3

End Point Electrical Parameters (Method 5005)

* PDA applies to subgroup 1. See PDA Test Notes.

15V

–15V

10k

8V

RH1014M TDBC

+

–

10k

TOTAL DOSE KRAD (Si)

1

0.8

0.6

0.4

0.2

0

10

100

1000

RH1014M G01

VS = ±15V

RL = 10k

Supply Current (Per Amplifier)

Negative Slew Rate

Positive Slew Rate

TOTAL DOSE KRAD (Si)

1

0.8

0.6

0.4

0.2

0

10

100

1000

RH1014M G03

VS = ±15V

RL = 10k

TOTAL DOSE KRAD (Si)

1

0.8

0.6

0.4

0.2

0

10

100

1000

RH1014M G02

VS = ±15V

RL = 10k