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MAX3237ECAI Datasheet(PDF) 14 Page - Maxim Integrated Products |
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MAX3237ECAI Datasheet(HTML) 14 Page - Maxim Integrated Products |
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14 / 22 page ![]() Figure 6a shows the transmitter output voltages under increasing load current at +3.0V. Figure 6b shows a typical mouse connection using the MAX3241E. High Data Rates The MAX3222E/MAX3232E/MAX3237E/MAX3241E/ MAX3246E maintain the RS-232 ±5V minimum transmit- ter output voltage even at high data rates. Figure 7 shows a transmitter loopback test circuit. Figure 8 shows a loopback test result at 120kbps, and Figure 9 shows the same test at 250kbps. For Figure 8, all trans- mitters were driven simultaneously at 120kbps into RS- 232 loads in parallel with 1000pF. For Figure 9, a single transmitter was driven at 250kbps, and all transmitters were loaded with an RS-232 receiver in parallel with 1000pF. The MAX3237E maintains the RS-232 ±5.0V minimum transmitter output voltage at data rates up to 1Mbps. Figure 10 shows a loopback test result at 1Mbps with MBAUD = VCC. For Figure 10, all transmitters were loaded with an RS-232 receiver in parallel with 250pF. Interconnection with 3V and 5V Logic The MAX3222E/MAX3232E/MAX3237E/MAX3241E/ MAX3246E can directly interface with various 5V logic families, including ACT and HCT CMOS. See Table 3 for more information on possible combinations of inter- connections. UCSP Reliability The UCSP represents a unique packaging form factor that may not perform equally to a packaged product through traditional mechanical reliability tests. UCSP reliability is integrally linked to the user’s assembly methods, circuit board material, and usage environ- ment. The user should closely review these areas when considering use of a UCSP package. Performance through Operating Life Test and Moisture Resistance remains uncompromised as the wafer-fabrication process primarily determines it. Mechanical stress performance is a greater considera- tion for a UCSP package. UCSPs are attached through direct solder contact to the user’s PC board, foregoing the inherent stress relief of a packaged product lead frame. Solder joint contact integrity must be consid- ered. Table 4 shows the testing done to characterize the UCSP reliability performance. In conclusion, the UCSP is capable of performing reliably through envi- ronmental stresses as indicated by the results in the table. Additional usage data and recommendations are detailed in the UCSP application note, which can be found on Maxim’s website at www.maxim-ic.com. ±15kV ESD-Protected, Down to 10nA, 3.0V to 5.5V, Up to 1Mbps, True RS-232 Transceivers 14 ______________________________________________________________________________________ Table 4. Reliability Test Data TEST CONDITIONS DURATION FAILURES PER SAMPLE SIZE Temperature Cycle TA = -35°C to +85°C, TA = -40°C to +100°C 150 cycles, 900 cycles 0/10, 0/200 Operating Life TA = +70°C 240 hours 0/10 Moisture Resistance TA = +20°C to +60°C, 90% RH 240 hours 0/10 Low-Temperature Storage TA = -20°C 240 hours 0/10 Low-Temperature Operational TA = -10°C 24 hours 0/10 Solderability 8-hour steam age — 0/15 ESD ±15kV, Human Body Model — 0/5 High-Temperature Operating Life TJ = +150°C 168 hours 0/45 |
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