TC221, TC225, TC227

SMALL-FORMAT CCD IMAGE SENSORS

SOCS037C – DECEMBER 1991 – REVISED AUGUST 1997

10

POST OFFICE BOX 655303

0 V to 15 V

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

– 15 V to 15 V

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

–10

°C to 60°C

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Storage temperature range

– 30

°C to 85°C

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

† Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and

functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not

implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

NOTE 1: All voltage values are with respect to the substrate.

recommended operating conditions

MIN

NOM

MAX

UNIT

Supply voltage, VCC

ADB

11

12

13

V

Substrate bias voltage

0

V

‡

IAG

High level

1.5

2

2.5

‡

IAG

Low level

–11

–10

–9

‡

SRG

High level

1.5

2

2.5

‡

SRG

Low level

–11

–10

–9

Input voltage, VI‡

High level

11

V

ABG

Intermediate level§

–3

Low level

–6

TRG

High level

1.5

2

2.5

TRG

Low level

–11

–10

–9

Pulse duration

IAG

0.7

1.0

1.3

µs

Clock frequency f lk

SRG, TRG

10

MHz

Clock frequency, fclock

ABG

4

MHz

Load capacitance

6

pF

Operating free-air temperature, TA

–10

45

°C

‡ The algebraic convention, in which the least positive (most negative) value is designated minimum, is used in this data sheet for clock voltage

levels.

§ The antiblooming gate clocks from high level to intermediate level during exposure time and is held at low level during readout time.