DAC5682Z datasheet(18/56 Pages) TI

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DAC-A

DAC-B

100

opt.

PLL

Loop

Filter

DLL

DAC5682ZDAC

CDCM7005

DCLK

SYNC

D15

Agilent 81205A

ParBERT

Pattern

Memory

100

Opt.

Clock

Divider

DAC5682ZEVM

DAC5682ZEVMSMAAdapterBoard

100

3.3 V

Agilent 8133A

PulseGenerator

Optional

Divider

HP8665B

Synthesized

Signal

Generator

Rohde &

Schwartz

FSU

Spectrum

Analyzer

36 each

SMA-SMAcables

SwapCable

ForDAC-B

measurements

DEFINITION OF SPECIFICATIONS

DAC5682Z

SLLS853A – AUGUST 2007 – REVISED NOVEMBER 2007

Figure 25. DAC5682Z Test Configuration for Normal Clock Mode

Adjacent Carrier Leakage Ratio (ACLR): Defined for a 3.84Mcps 3GPP W-CDMA input signal measured in a

3.84MHz bandwidth at a 5MHz offset from the carrier with a 12dB peak-to-average ratio.

Analog and Digital Power Supply Rejection Ratio (APSSR, DPSSR): Defined as the percentage error in the

ratio of the delta IOUT and delta supply voltage normalized with respect to the ideal IOUT current.

Differential Nonlinearity (DNL): Defined as the variation in analog output associated with an ideal 1 LSB

change in the digital input code.

Gain Drift: Defined as the maximum change in gain, in terms of ppm of full-scale range (FSR) per

°C, from the

value at ambient (25

°C) to values over the full operating temperature range.

Gain Error: Defined as the percentage error (in FSR%) for the ratio between the measured full-scale output

current and the ideal full-scale output current.

Integral Nonlinearity (INL): Defined as the maximum deviation of the actual analog output from the ideal output,

determined by a straight line drawn from zero scale to full scale.

Intermodulation Distortion (IMD3, IMD): The two-tone IMD3 or four-tone IMD is defined as the ratio (in dBc) of

the worst 3rd-order (or higher) intermodulation distortion product to either fundamental output tone.

Offset Drift: Defined as the maximum change in DC offset, in terms of ppm of full-scale range (FSR) per

°C,

from the value at ambient (25

°C) to values over the full operating temperature range.

Offset Error: Defined as the percentage error (in FSR%) for the ratio of the differential output current

(IOUT1–IOUT2) and the mid-scale output current.

Output Compliance Range: Defined as the minimum and maximum allowable voltage at the output of the

current-output DAC. Exceeding this limit may result reduced reliability of the device or adversely affecting

distortion performance.

Reference Voltage Drift: Defined as the maximum change of the reference voltage in ppm per degree Celsius

from value at ambient (25

°C) to values over the full operating temperature range.

Spurious Free Dynamic Range (SFDR): Defined as the difference (in dBc) between the peak amplitude of the

output signal and the peak spurious signal.

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