CC2541-Q1

SWRS128 – JUNE 2014

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4.10

32.768-kHz Crystal Oscillator

Measured on Texas Instruments CC2541-Q1 EM reference design with TA = 25°C and VDD = 3 V

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Crystal frequency

32.768

kHz

Crystal frequency accuracy requirement(1)

–40

40

ppm

ESR

Equivalent series resistance

40

130

k

Ω

C0

Crystal shunt capacitance

0.9

2

pF

CL

Crystal load capacitance

12

16

pF

Start-up time

0.4

s

(1)

Including aging and temperature dependency, as specified by [1]

4.11

32-kHz RC Oscillator

Measured on Texas Instruments CC2541-Q1 EM reference design with TA = 25°C and VDD = 3 V.

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Calibrated frequency(1)

32.753

kHz

Frequency accuracy after calibration

±0.2%

Temperature coefficient(2)

0.4

%/°C

Supply-voltage coefficient(3)

3

%/V

Calibration time(4)

2

ms

(1)

The calibrated 32-kHz RC oscillator frequency is the 32-MHz XTAL frequency divided by 977.

(2)

Frequency drift when temperature changes after calibration

(3)

Frequency drift when supply voltage changes after calibration

(4)

When the 32-kHz RC oscillator is enabled, it is calibrated when a switch from the 16-MHz RC oscillator to the 32-MHz crystal oscillator

is performed while SLEEPCMD.OSC32K_CALDIS is set to 0.

4.12

16-MHz RC Oscillator

Measured on Texas Instruments CC2541-Q1 EM reference design with TA = 25°C and VDD = 3 V

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Frequency(1)

16

MHz

Uncalibrated frequency accuracy

±18%

Calibrated frequency accuracy

±0.6%

Start-up time

10

μs

Initial calibration time(2)

50

μs

(1)

The calibrated 16-MHz RC oscillator frequency is the 32-MHz XTAL frequency divided by 2.

(2)

When the 16-MHz RC oscillator is enabled, it is calibrated when a switch from the 16-MHz RC oscillator to the 32-MHz crystal oscillator

is performed while SLEEPCMD.OSC_PD is set to 0.

12

Specifications

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