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AFE5808ZCF.B Datasheet(PDF) 22 Page - Texas Instruments |
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AFE5808ZCF.B Datasheet(HTML) 22 Page - Texas Instruments |
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22 / 75 page ![]() AFE5808 SLOS688D – SEPTEMBER 2010 – REVISED JANUARY 2014 www.ti.com TIMING CHARACTERISTICS (1) Typical values are at 25°C, AVDD_5V = 5 V, AVDD = 3.3 V, AVDD_ADC = 1.8 V, DVDD = 1.8 V, Differential clock, CLOAD = 5 pF, RLOAD = 100 Ω, 14 Bit, sample rate = 65 MSPS, unless otherwise noted. Minimum and maximum values are across the full temperature range TMIN = 0°C to TMAX = 85°C with AVDD_5V = 5 V, AVDD = 3.3 V, AVDD_ADC = 1.8 V, DVDD = 1.8 V PARAMETER TEST CONDITIONS MIN TYP MAX UNIT The delay in time between the rising edge of the input sampling ta Aperture delay 0.7 3 ns clock and the actual time at which the sampling occurs Aperture delay Across channels within the same device ±150 ps matching tj Aperture jitter 450 Fs rms Input ADC latency Default, after reset, or / 0 x 2 [12] = 1, LOW_LATENCY = 1 11/8 clock cycles tdelay Data and frame clock Input clock rising edge (zero cross) to frame clock rising edge (zero 3 5.4 7 ns delay cross) minus 3/7 of the input clock period (T). Δtdelay Delay variation At fixed supply and 20°C T difference. Device to device –1 1 ns tRISE Data rise time Rise time measured from –100 to 100 mV Fall time measured from 0.14 ns 100 to –100 mV 10 MHz < fCLKIN < 65MHz tFALL Data fall time 0.15 tFCLKRISE Frame clock rise time Rise time measured from –100 to 100 mV Fall time measured from 0.14 ns 100 to –100 mV 10 MHz < fCLKIN < 65MHz tFCLKFALL Frame clock fall time 0.15 Frame clock duty cycle Zero crossing of the rising edge to zero crossing of the falling edge 48% 50% 52% tDCLKRISE Bit clock rise time Rise time measured from –100 to 100 mV Fall time measured from 0.13 ns 100 to –100 mV 10 MHz < fCLKIN < 65MHz tDCLKFALL Bit clock fall time 0.12 Zero crossing of the rising edge to zero crossing of the falling edge Bit clock duty cycle 46% 54% 10MHz < fCLKIN < 65MHz (1) Timing parameters are specified by design and characterization; not production tested. OUTPUT INTERFACE TIMING (1) (2) (3) Setup Time (tsu), ns Hold Time (th), ns tPROG = (3/7)x T + tdelay, ns fCLKIN, Input Clock Zero-Cross (rising edge) Input Clock Data Valid to Bit Clock Zero- Bit Clock Zero-Crossing to Data to Frame Clock Zero-Cross (rising Frequency Crossing Invalid edge) MHz MIN TYP MAX MIN TYP MAX MIN TYP MAX 65 0.24 0.37 0.24 0.38 11 12 12.5 50 0.41 0.54 0.46 0.57 13 13.9 14.4 40 0.55 0.70 0.61 0.73 15 16 16.7 30 0.87 1.10 0.94 1.1 18.5 19.5 20.1 20 1.30 1.56 1.46 1.6 25.7 26.7 27.3 (1) FCLK timing is the same as for the output data lines. It has the same relation to DCLK as the data pins. Setup and hold are the same for the data and the frame clock. (2) Data valid is logic HIGH = +100 mV and logic LOW = –100 mV (3) Timing parameters are specified by design and characterization; not production tested. 22 Submit Documentation Feedback Copyright © 2010–2014, Texas Instruments Incorporated Product Folder Links: AFE5808 |
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