LM5102

www.ti.com

SNVS268B – MAY 2004 – REVISED DECEMBER 2014

6.5 Electrical Characteristics

Specifications in standard typeface are for TJ = +25°C. Unless otherwise specified, VDD = VHB = 12 V, VSS = VHS = 0V, RT1 =

RT2 = 100 k

Ω. No load on LO or HO.

PARAMETER

TEST CONDITIONS

MIN(1)

TYP

MAX(1)

UNIT

SUPPLY CURRENTS

LI = HI = 0 V

0.4

IDD

VDD Quiescent Current

mA

LI = HI = 0 V, –40°C to +125°C

0.6

f = 500 kHz

1.5

IDDO

VDD Operating Current

mA

f = 500 kHz, –40°C to +125°C

3

LI = HI = 0 V

0.06

IHB

Total HB Quiescent Current

mA

LI = HI = 0 V, –40°C to +125°C

0.2

f = 500 kHz

1.3

IHBO

Total HB Operating Current

mA

f = 500 kHz, –40°C to +125°C

3

VHS = VHB = 100 V

0.05

IHBS

HB to VSS Current, Quiescent

µA

VHS = VHB = 100 V, –40°C to

10

+125°C

IHBSO

HB to VSS Current, Operating

f = 500 kHz

0.08

mA

INPUT PINS

1.8

VIL

Low Level Input Voltage Threshold

V

–40°C to +125°C

0.8

1.8

VIH

High Level Input Voltage Threshold

V

–40°C to +125°C

2.2

200

RI

Input Pulldown Resistance

k

Ω

–40°C to +125°C

100

500

TIME DELAY CONTROLS

3

VRT

Nominal Voltage at RT1, RT2

V

–40°C to +125°C

2.7

3.3

RT1 = RT2 = 0 V

1.5

IRT

RT Pin Current Limit

mA

RT1 = RT2 = 0 V, –40°C to +125°C

0.75

2.25

Vth

Timer Termination Threshold

1.8

V

105

Rising edge turn-on delay, RT = 10

TDL1, TDH1

ns

k

Ω

–40°C to +125°C

75

150

630

Rising edge turn-on delay, RT = 100

TDL2, TDH2

ns

k

Ω

–40°C to +125°C

530

750

UNDER VOLTAGE PROTECTION

6.9

VDDR

VDD Rising Threshold

V

–40°C to +125°C

6.0

7.4

VDDH

VDD Threshold Hysteresis

0.5

V

6.6

VHBR

HB Rising Threshold

V

–40°C to +125°C

5.7

7.1

VHBH

HB Threshold Hysteresis

0.4

V

BOOTSTRAP DIODE

IVDD-HB = 100 µA

0.60

VDL

Low-Current Forward Voltage

V

IVDD-HB = 100 µA, –40°C to +125°C

0.9

IVDD-HB = 100 mA

0.85

VDH

High-Current Forward Voltage

V

IVDD-HB = 100 mA, –40°C to +125°C

1.1

(1)

MIN and MAX limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlation

using Statistical Quality Control (SQC) methods. Limits are used to calculate TI’s Average Outgoing Quality Level (AOQL).

Copyright © 2004–2014, Texas Instruments Incorporated

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