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LM5102 Datasheet(PDF) 6 Page - Texas Instruments

Part # LM5102
Description  LM5102 High-Voltage Half-Bridge Gate Driver With Programmable Delay
PDF  24 Pages
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Manufacturer  TI2 [Texas Instruments]
Direct Link  https://www.ti.com
Logo TI2 - Texas Instruments

LM5102 Datasheet(HTML) 6 Page - Texas Instruments

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LM5102
SNVS268B – MAY 2004 – REVISED DECEMBER 2014
www.ti.com
Electrical Characteristics (continued)
Specifications in standard typeface are for TJ = +25°C. Unless otherwise specified, VDD = VHB = 12 V, VSS = VHS = 0V, RT1 =
RT2 = 100 k
Ω. No load on LO or HO.
PARAMETER
TEST CONDITIONS
MIN(1)
TYP
MAX(1)
UNIT
IVDD-HB = 100 mA
0.8
RD
Dynamic Resistance
IVDD-HB = 100 mA, –40°C to +125°C
1.5
LO GATE DRIVER
ILO = 100 mA
0.25
VOLL
Low-Level Output Voltage
V
ILO = 100 mA, –40°C to +125°C
0.4
ILO = –100 mA, VOHL = VDD – VLO
0.35
VOHL
High-Level Output Voltage
V
ILO = –100 mA, VOHL = VDD – VLO,
0.55
–40°C to +125°C
IOHL
Peak Pullup Current
VLO = 0 V
1.6
A
IOLL
Peak Pulldown Current
VLO = 12 V
1.8
A
HO GATE DRIVER
IHO = 100 mA
0.25
VOLH
Low-Level Output Voltage
V
IHO = 100 mA, –40°C to +125°C
0.4
IHO = –100 mA, VOHH = VHB – VHO
0.35
VOHH
High-Level Output Voltage
V
IHO = –100 mA, VOHH = VHB – VHO,
0.55
–40°C to +125°C
IOHH
Peak Pullup Current
VHO = 0 V
1.6
A
IOLH
Peak Pulldown Current
VHO = 12 V
1.8
A
6.6 Switching Characteristics
Specifications in standard typeface are for TJ = +25°C. Unless otherwise specified, VDD = VHB = 12 V, VSS = VHS = 0 V, No
Load on LO or HO.
PARAMETER
TEST CONDITIONS
MIN(1)
TYP
MAX(1)
UNIT
27
Lower Turn-Off Propagation Delay LM5102
tLPHL
ns
(LI Falling to LO Falling)
–40°C to +125°C
56
27
Upper Turn-Off Propagation Delay LM5102
tHPHL
ns
(HI Falling to HO Falling)
–40°C to +125°C
56
tRC, tFC
Either Output Rise/Fall Time
CL = 1000 pF
15
ns
tR, tF
Either Output Rise/Fall Time (3 V to 9 V)
CL = 0.1 µF
0.6
µs
tBS
Bootstrap Diode Turn-Off Time
IF = 20 mA, IR = 200 mA
50
ns
(1)
MIN and MAX limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlation
using Statistical Quality Control (SQC) methods. Limits are used to calculate TI’s Average Outgoing Quality Level (AOQL).
6
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Copyright © 2004–2014, Texas Instruments Incorporated
Product Folder Links: LM5102



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