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SN54LVC138A, SN74LVC138A

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SCAS291W – MARCH 1993 – REVISED OCTOBER 2016

Product Folder Links: SN54LVC138A SN74LVC138A

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Copyright © 1993–2016, Texas Instruments Incorporated

(1)

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings

only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended

Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

The input and output negative-voltage ratings may be exceeded if the input and output current ratings are observed.

(3)

The value of VCC is provided in the recommended operating conditions table.

6 Specifications

6.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)

(1)

MIN

MAX

UNIT

VCC

Supply voltage

–0.5

6.5

V

VI

Input voltage(2)

–0.5

6.5

V

VO

Output voltage(2)(3)

–0.5

VCC + 0.5

V

IIK

Input clamp current

VI < 0

–50

mA

IOK

Output clamp current

VO < 0

–50

mA

IO

Continuous output current

±50

mA

Continuous current through VCC or GND

±100

mA

Tstg

Storage temperature

–65

150

°C

TJ

Junction temperature

150

°C

(1)

JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.

(2)

JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.

6.2 ESD Ratings

VALUE

UNIT

V(ESD)

Electrostatic discharge

Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)

2000

V

Charged-device model (CDM), per JEDEC specification JESD22-

C101(2)

1000

Machine model (MM)

200